Studies on the Growth and Defects of La3ga5sio14 (lgs) Crystals

ZM Wang,DR Yuan,D Xu,MK Lv,LH Pan
DOI: https://doi.org/10.1002/crat.200310123
2003-01-01
Crystal Research and Technology
Abstract:New and high quality piezoelectric crystals La3Ga5SiO14 (LGS) grown by the Czochralski method in a Platinum or Iridium crucible are reported in this paper. The growth defects in the LGS crystals were investigated by Transmission electron microscopy (TEM). It was found that cracks, inclusions, gain boundary and thermal stress in the LGS crystals. Their formation mechanisms and the method of eliminating these defects are discussed. (C) 2003 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
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