Abstract:Cross-talk effect which always exits in atomic force microscopy(AFM) measurement severely influences the measuring accuracy.The generation mechanism of cross-talk effect was theoretically analyzed and the relationship between deformation of the cantilever and output of position sensitive photo-detecter(PSPD) was established,on which basis a correction method was proposed to eliminate the influence of the cross-talk effect.In the proposed method,AFM system directly obtains the deformation of the cantilever from the output signals.Therefore,the real value of inter-atomic force can be calculated,which is then kept constant in AFM measurement.By using this method,the change of vertical signal resulting from the torsion of the cantilever can be effectively rejected from the total vertical signal detected by the system.Simulation results show that in constant force mode,cross-talk effect has great impact on the measuring results,leading to measuring error and the cross-talk effect caused by tip-sample angle is much greater than that caused by friction.To verify the elimination of cross-talk effect of the proposed method,comparative experiments were performed on a standard sample.Results indicate that the largest range of measuring error decreases from 21.2 nm-32.0 nm to 5.5 nm-10.2 nm after the correction method was applied,which proves that the proposed method can effectively reduce the measuring error caused by cross-talk effect and enhance the measuring accuracy of AFM.

Tilt of Atomic Force Microscope Cantilevers: Effect on Friction Measurements

Application of Triangular Atomic Force Microscopy Cantilevers to Friction Measurement with the Improved Parallel Scan Method.

Improved Calibration Method For Lateral Force Of The Cantilever Deflection Force Sensor In Atomic Force Microscope

Velocity-dependent nano-scale friction under atomic force microscope

Calibration of the Effective Spring Constant of Ultra-Short Cantilevers for A High-Speed Atomic Force Microscope

A New AFM Nanotribology Method Using a T-Shape Cantilever with an Off-Axis Tip for Friction Coefficient Measurement with Minimized Abbé Error

Improved Parallel Scan Method for Nanofriction Force Measurement with Atomic Force Microscopy

Effect of contact stiffness on wedge calibration of lateral force in atomic force microscopy.

Thermo-mechanical responses of a surface-coupled AFM cantilever.

Comment On "Influence Of Atomic Force Microscope Cantilever Tilt And Induced Torque On Force Measurements" [J. Appl. Phys. 103, 064513 (2008)]

Correction of Cross-Talk Caused by Torsion of Cantilever in AFM

Improved Wedge Method of the AFM Friction Force Calibration

On Micro Scanning Forces under the Coupling Deformation of Atomic Force Microscope Probe

Friction Determination by Atomic Force Microscopy in Field of Biochemical Science

A comprehensive study of AFM stiffness measurements on inclined surfaces: theoretical, numerical, and experimental evaluation using a Hertz approach

Cantilever Tilt Causing Amplitude Related Convolution in Dynamic Mode Atomic Force Microscopy.

Effects of the Casimir Force and Surface Elasticity on the Natural Frequencies of Cantilever AFM Probes

Comparison between Atomic Force Microscopy and Force Feedback Microscopy static force curves

Effect of Sample Tilt on Measurement of Friction Coefficient by Constant-Load Scratch Testing of Copper with a Spherical Indenter

Edge Effects and Coupling Effects in Atomic Force Microscope Images

AFM probe with the U-shaped cross-sectional cantilever for measuring the ultra-low coefficient of friction of 10−6