Velocity-dependent nano-scale friction under atomic force microscope

Zhang Yan,Wang Yujuan,Chen Yunfei
DOI: https://doi.org/10.3969/j.issn.1001-0505.2012.02.018
2012-01-01
Abstract:The effect of the scanning velocity on the friction in a convex system is studied between a Si tip and a naturally oxidized Si(100) substrate by the atomic force microscope(AFM).Firstly,the normal spring constant and the normal sensitivity of the Si cantilever are calibrated by the thermal noise calibration method.Then,the lateral sensitivity is obtained through scanning a triangular grating by the improved wedge calibration method.Finally,the friction-load relation curves with the scan area of 15 μm×15 μm,the normal force of-5~10 nN and the scanning velocity of 2.5~1 000 μm/s are obtained.The experimental results show that with different velocities,the friction increases nearly linearly with the load,which obeys the classical Coulomb law.When the scanning velocity is below 40 μm/s,the increase in the friction is insignificant due to the increase in the velocity.In contrast,when the velocity exceeds 40 μm/s,the friction enhancement becomes significant.The nonlinear correlation between the frictional force and the scanning velocity coincides with the results computed by the thermally-excited Tomlinson model.
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