Abstract:Two independent lateral-force calibration methods for the atomic force microscope (AFM)—the hammerhead (HH) technique and the diamagnetic lateral force calibrator (D-LFC)—are systematically compared and found to agree to within 5 % or less, but with precision limited to about 15 %, using four different tee-shaped HH reference probes. The limitations of each method, both of which offer independent yet feasible paths toward traceable accuracy, are discussed and investigated. We find that stiff cantilevers may produce inconsistent D-LFC values through the application of excessively high normal loads. In addition, D-LFC results vary when the method is implemented using different modes of AFM feedback control, constant height and constant force modes, where the latter is more consistent with the HH method and closer to typical experimental conditions. Specifically, for the D-LFC apparatus used here, calibration in constant height mode introduced errors up to 14 %. In constant force mode using a relatively stiff cantilever, we observed an ≈ 4 % systematic error per μN of applied load for loads ≤ 1 μN. The issue of excessive load typically emerges for cantilevers whose flexural spring constant is large compared with the normal spring constant of the D-LFC setup (such that relatively small cantilever flexural displacements produce relatively large loads). Overall, the HH method carries a larger uncertainty, which is dominated by uncertainty in measurement of the flexural spring constant of the HH cantilever as well as in the effective length dimension of the cantilever probe. The D-LFC method relies on fewer parameters and thus has fewer uncertainties associated with it. We thus show that it is the preferred method of the two, as long as care is taken to perform the calibration in constant force mode with low applied loads.

Comparison between Atomic Force Microscopy and Force Feedback Microscopy static force curves

Measurement of the complete interaction force curve at the nanoscale

Atomic Force Microscope (AFM)

Re-evaluation of the Widely Applied Force-Frequency Relation for Frequency-Modulation AFM under Solution

Atomic Force Microscopy Force-Distance Curves with Small Amplitude Ultrasonic Modulation.

A Novel Method to Reconstruct the Force Curve by Higher Harmonics of the First Two Flexural Modes in Frequency Modulation Atomic Force Microscope (FM-AFM).

Quantitative Comparison of Two Independent Lateral Force Calibration Techniques for the Atomic Force Microscope.

A Horizontal Atomic Force Microscope and Its Applications

FRICTION FORCE MICROSCOPY AND MICRO-FRICTION CHARACTER OF SOME MATERIALS

Application of Triangular Atomic Force Microscopy Cantilevers to Friction Measurement with the Improved Parallel Scan Method.

Friction Determination by Atomic Force Microscopy in Field of Biochemical Science

Analysis of Dynamic Characteristics of Cantilevers Excited at the Fixed End in Dynamic Atomic Force Microscopy in Liquid Environments

Tilt of Atomic Force Microscope Cantilevers: Effect on Friction Measurements

Calibrating Force Measurement Coefficient of Atomic Force Microscopy with Force-distance Curve

Thermo-mechanical responses of a surface-coupled AFM cantilever.

How to Measure Forces when the Atomic Force Microscope shows Non-Linear Compliance

Velocity-dependent nano-scale friction under atomic force microscope

Finite Element Modelling of Atomic Force Microscopy Imaging on Deformable Surfaces

Quantitative Measurements of Electromechanical Response with a Metrological Atomic Force Microscope

Quadrature phase interferometer for high resolution force spectroscopy

Improved Parallel Scan Method for Nanofriction Force Measurement with Atomic Force Microscopy