Abstract:We present a new comprehensive mathematical model of the cone-shaped cantilever tip-sample interaction in Atomic Force Microscopy (AFM). The importance of such AFMs with cone-shaped cantilevers can be appreciated when its ability to provide high-resolution information at the nanoscale is recalled. It is an indispensable tool in a wide range of scientific and industrial fields. The interaction of the cone-shaped cantilever tip with the surface of the specimen (sample) is modeled by the damped Euler-Bernoulli beam equation $ \rho_A(x)u_{tt} $ $ +\mu(x)u_{t}+(r(x)u_{xx}+\kappa(x)u_{xxt})_{xx} = 0 $, $ (x, t)\in (0, \ell)\times (0, T) $, subject to the following initial, $ u(x, 0) = 0 $, $ u_t(x, 0) = 0 $ and boundary, $ u(0, t) = 0 $, $ u_{x}(0, t) = 0 $, $ \left (r(x)u_{xx}(x, t)+\kappa(x)u_{xxt} \right)_{x = \ell} = M(t) $, $ \left (-(r(x)u_{xx}+\kappa(x)u_{xxt})_x\right)_{x = \ell} = g(t) $ conditions, where $ M(t): = 2h\cos \theta\, g(t)/\pi $ is the moment generated by the transverse shear force $ g(t) $. Based on this model, we propose an inversion algorithm for the reconstruction of an unknown shear force in the AFM cantilever. The measured displacement $ \nu(t): = u(\ell, t) $ is used as additional data for the reconstruction of the shear force $ g(t) $. The least square functional $ J(F) = \frac{1}{2}\Vert u(\ell, \cdot)-\nu \Vert_{L^2(0, T)}^2 $ is introduced and an explicit gradient formula for the Fréchet derivative of the cost functional is derived via the weak solution of the adjoint problem. Additionally, the geometric parameters of the cone-shaped tip are explicitly contained in this formula. This enables us to construct a gradient based numerical algorithm for the reconstructions of the shear force from noise free as well as from random noisy measured output $ \nu (t) $. Computational experiments show that the proposed algorithm is very fast and robust. This creates the basis for developing a numerical "gadget" for computational experiments with generic AFMs.

Cantilever Tilt Causing Amplitude Related Convolution in Dynamic Mode Atomic Force Microscopy.

Investigation on the Impact of Excitation Amplitude on AFM-TM Microcantilever Beam System's Dynamic Characteristics and Implementation of an Equivalent Circuit

Towards High Accuracy Surface Profile Characterization in Atomic Force Microscopy

"Reported Goals of Instructors of Responsible Conduct of Research for Teaching of Skills".

On Micro Scanning Forces under the Coupling Deformation of Atomic Force Microscope Probe

Reconstruction of shear force in Atomic Force Microscopy from measured displacement of the cone-shaped cantilever tip

Calibration of the Effective Spring Constant of Ultra-Short Cantilevers for A High-Speed Atomic Force Microscope

Dynamical Characterization of Micro Cantilevers by Different Excitation Methods in Dynamic Atomic Force Microscopy.

Nonlinear dynamic analysis of atomic force microscopy under bounded noise parametric excitation

Multi-mode Dynamic Atomic Force Microscope System

Effect of lateral tip motion on multifrequency atomic force microscopy

Directional Energy Transfer in a Coupled Symmetrical Multifrequency Atomic Force Microscope Cantilever

Simulation and experimental analysis of tip response of tapping mode atomic force microscope

A Novel Atomic Force Microscope with High Stability and Scan Speed

Dynamic analysis of tapping-mode AFM with sidewall probe subjected to effects of probe mass and sidewall extension

Chaotic Criterion for Micro-Cantilevers of Atomic Force Microscopes

Thermal fuctuations and dynamic modelling of a dAFM cantilever

The Role of Nonlinear Dynamics in Quantitative Atomic Force Microscopy

Flexoelectric Control of Beams with Atomic Force Microscope Probe Excitation

Microfabricated double-tilt apparatus for transmission electron microscope imaging of atomic force microscope probe