Nonlinear dynamic analysis of atomic force microscopy under bounded noise parametric excitation

Wenming Zhang,Guang Meng,Z. K. Peng
DOI: https://doi.org/10.1109/TMECH.2010.2073715
2011-01-01
IEEE/ASME Transactions on Mechatronics
Abstract:When the vibrating microcantilever in an atomic force microscope (AFM) is close to the sample surface, the nonlinear tip-sample interaction will greatly influence the dynamics of the cantilever. In this paper, the effect of the bounded noise parametric excitation on the nonlinear dynamic behavior of dynamic AFM system is investigated. The microcantilever is modeled by a single-lumped-mode approxim...
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