A Novel Atomic Force Microscope with High Stability and Scan Speed

Yulin He,Dongxian Zhang,Haijun Zhang
DOI: https://doi.org/10.1080/10739140600809702
2006-01-01
Instrumentation Science & Technology
Abstract:A novel atomic force microscope (AFM) has been developed. Unlike conventional AFM systems, its cantilever and tip were set up in the X direction with respect to the sample. It can practically eliminate the crawling effect of the probe itself. Meanwhile, using a beam splitter, we devised a unique path optical beam deflection method for the measurement of the cantilever's displacement with its minimized structure and an optimal light-amplifying ratio; the position of the sensitive detector (PSD) is just in front of the visual sight of operator. This makes observation and operation easier. Furthermore, the PSD attached to the translation stage can be adjusted and, thus, adapts the setpoint of imaging force to different samples. In this way, our new AFM provides high stability and scan speed. The highest scan rate is about 40 lines/s or 10s for a 400 x 400-pixel, 3 mu m x 3 mu m image.
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