An aluminum oxynitride film

Wang Dehuang,Guo Liang
DOI: https://doi.org/10.1016/0040-6090(91)90339-Y
IF: 2.1
1991-01-01
Thin Solid Films
Abstract:We report on an aluminum oxynitride (AlON) film which was successfully made using the reactiver r.f. sputtering method in an N2-O2 mixture. The fabrication process, atomic components, breakdown field and refractive index of the AlON film are shown in detail. The AlON film is a new polyfilm combining the good properties of Al2O3 and AlN, and it is very interesting with regard to optoelectronic devices and integrated optic circuits.
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