PTPD/Alq3 Heterostructure Electroluminescent Diode and Its Stability

Hai Nie,Bo Zhang,Xian-zhong Tang,Yuan-xun Li
DOI: https://doi.org/10.3321/j.issn:1000-565X.2006.01.011
2006-01-01
Abstract:ITO/PTPD/Alq_3/Mg:Ag heterostructure electroluminescent diode was fabricated by using a novel poly-TPD as the hole transport material,and its electroluminescent properties was investigated.The results indicate that only the intrinsic emission of PTPD(poly-TPD) is obtained when Alq_3 layer is very thin(not more than 10nm),and that only the intrinsic emission of Alq_3 is obtained when the thickness of Alq_3 layer is up to 50nm.Moreover,the fabricated diode is of an improved stability due to the excellent thermal stability and film quality of PTPD,as compare with the typical ITO/TPD/Alq_3/Mg:Ag device.
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