A novel self-aligned process for platinum silicide nanowires

Zhen Zhang,Per-Erik Hellström,Jun Lu,Mikael Östling,Shi-Li Zhang
DOI: https://doi.org/10.1016/j.mee.2006.09.032
IF: 2.3
2006-01-01
Microelectronic Engineering
Abstract:Directly accessible, ultralong, uniform platinum silicide nanowires in PtSi and Pt"2Si are mass-fabricated by combining a sidewall transfer lithography (STL) technology and a self-aligned silicide process. The STL technology is based on standard Si technology. The self-aligned platinum silicide (PtSi"x) process consists of two sequential steps in a single run: a silicidation step in N"2 to ensure a controllable silicide formation followed by an oxidation step in O"2 to form a reliable protective SiO"x layer on top of the grown PtSi"x. The achieved nanowires are characterised by a low resistivity: 26+/-3 and 34+/-2@m@Wcm for the Pt"2Si- and PtSi-dominated nanowires.
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