Electrical switching properties of Ag2S/Cu3P under light and heat excitation

Xin Guo,Yanfei Lv,Manru Chen,Junhua Xi,Li Fu,Shichao Zhao
DOI: https://doi.org/10.1016/j.heliyon.2024.e33569
IF: 3.776
2024-06-26
Heliyon
Abstract:In this paper, we prepared and investigated the electrical switching behaviors of Cu3P/Ag2S heterojunction in the absence/presence of light/heat excitation. The structure exhibited bipolar memristor characteristics. The resistive switching mechanism is due to the formation of Ag conductive filaments and phase transition in Cu3P. We found that the resistance ratio (ROFF/RON) increased by a factor of 1.4/1.8 after light/heat excitation. The underlying mechanism was due to the photoelectric effect/Seebeck effect. Our results are helpful for the understanding of the resistive switching performance of Cu3P/Ag2S junctions, providing valuable insights into the factors influencing resistive switching performance and a clue for the enhancement of the memristor performance.
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