Abstract:Scanning electron microscopy is applied for tomographic imaging of ferroelectric domain walls. The position, orientation, and charge state of otherwise hidden walls are reconstructed, and a model is derived linking measured intensity variations to local domain‐wall properties. The approach facilitates high‐throughput screening of materials with functional domain walls, enabling monitoring during the production of devices and quality control in real‐time. Extraordinary physical properties arise at polar interfaces in oxide materials, including the emergence of 2D electron gases, sheet‐superconductivity, and multiferroicity. A special type of polar interface is ferroelectric domain walls, where electronic reconstruction phenomena can be driven by bound charges. Great progress has been achieved in the characterization of such domain walls and, over the last decade, their potential for next‐generation nanotechnology has become clear. Established tomography techniques, however, are either destructive or offer insufficient spatial resolution, creating a pressing demand for 3D imaging compatible with future fabrication processes. Here, non‐destructive tomographic imaging of ferroelectric domain walls is demonstrated using secondary electrons. Utilizing conventional scanning electron microscopy (SEM), the position, orientation, and charge state of hidden domain walls are reconstructed at distances up to several hundreds of nanometers away from the surface. A mathematical model is derived that links the SEM intensity variations at the surface to the local domain wall properties, enabling non‐destructive tomography with good noise tolerance on the timescale of seconds. The SEM‐based approach facilitates high‐throughput screening of materials with functional domain walls and domain‐wall‐based devices, which is essential for monitoring during the production of device architectures and quality control in real‐time.

Ferroelectric Domain Wall p-n Junctions

Domain-Wall P-N Junction in Lithium Niobate Thin Film on an Insulator

In-plane Charged Domain Walls with Memristive Behaviour in a Ferroelectric Film

Domain Wall Geometry Controls Conduction in Ferroelectrics.

Impact of Domain Wall Conduction on Ferroelectric Domain Reversal Kinetics

Comparative study of photo-induced electronic transport along ferroelectric domain walls in lithium niobate single crystals

Field Enhancement of Electronic Conductance at Ferroelectric Domain Walls

Microwave A.c. Conductivity of Domain Walls in Ferroelectric Thin Films.

Non-destructive tomographic nanoscale imaging of ferroelectric domain walls

Fundamental Aspects of Conduction in Charged ErMnO3 Domain Walls

Ultra-High Carrier Mobilities in Ferroelectric Domain Wall Corbino Cones at Room Temperature

Conductions through head-to-head and tail-to-tail domain walls in LiNbO3 nanodevices

Mixed Bloch-Néel-Ising Character Of180°ferroelectric Domain Walls

Non‐Destructive Tomographic Nanoscale Imaging of Ferroelectric Domain Walls

Domain wall architecture in tetragonal ferroelectric thin films

Electrical Tunability of Domain Wall Conductivity in LiNbO3 Thin Films

Charged ferroelectric domain walls for deterministic a.c. signal control

Intrinsic conductance of ferroelectric domain walls

Electric-Field-Induced Domain Walls in Wurtzite Ferroelectrics

Conductive domain walls in <i>x</i>-cut lithium niobate crystals