Abstract:The integration of on-chip temperature sensors within various systems, industrial Internet of Things (IoT), and wireless sensor networks is greatly facilitated by their small size, cost-effectiveness, and capability to provide direct digital output. However, the diverse application scenarios pose challenges in designing these sensors. On one hand, real-time clock calibration demands high-precision temperature sensors, while on-chip heat management emphasizes compactness and low-voltage operation. Additionally, streamlining the calibration cost for mass production holds significant practical value. Addressing these challenges, this study systematically investigates on-chip complementary metal-oxide-semiconductor (CMOS) temperature sensors based on distinct signal domains processed by temperature readout circuits. Specifically, the research commences by analyzing the issues of several degeneracy points in the front-end circuit of a bipolar junction transistor (BJT) temperature sensor with current gain compensation technology. To address the intricate design challenges in advanced technologies and calibration complexities in industrial applications, dynamic component matching, current gain compensation, and chopper stabilization are harnessed. A novel dynamic current gain canceling technique for temperature readout is introduced, enhancing temperature measurement accuracy without incurring additional power consumption or area overhead. Ultimately, an all-digital CMOS temperature sensor is realized using the SMIC 55 nm CMOS process. Occupying a mere 0.29 mm2 of core area, the design operates efficiently across a wide supply voltage range of 1.2 V to 3.6 V. Covering a temperature spectrum from −40 °C to 125 °C, the sensor demonstrates a calibration error of just ±0.7 °C. This achievement is attributed to the incorporation of the proposed dynamic current gain compensation technique.

Compensation for Process and Temperature Dependency in a CMOS Image Sensor

A 14-Bit Column-Parallel Two-Step SA ADC with On-Chip Scaled Reference Voltages Self-Calibration for CMOS Image Sensor

CMOS Digital Temperature Sensor with Self-Correcting Technique

An Untrimmed BJT-Based Temperature Sensor with Dynamic Current-Gain Compensation in 55-Nm CMOS Process

A CMOS Temperature Sensor with Versatile Readout Scheme and High Accuracy for Multi-Sensor Systems

A 14-Bit Column-Parallel Two-Step SA ADC with Digital Calibration Based on Scaled References and Redundancy for CMOS Image Sensors

Uniformity Correction of CMOS Image Sensor Modules for Machine Vision Cameras

14-Bit Column Readout Circuits with Single-to-differential PGA Using Intentional Offset and Two-Step Scaled-Reference SAR ADC for CMOS Image Sensors

A method to reduce process-related sensitivity in sub-threshold ICs and its circuit implementation

Research status of dark current in CMOS image sensor

Thermo-Hygro-Mechanical Design and Reliability Analysis for CMOS Image Sensor

Design and Simulation of an Application Specific CMOS Image Sensor

Design of High Precision Temperature Sensor with Current Gain Compensation Technology for On-Chip Application

Analyzing the Radiation Degradation of 4-Transistor Deep Submicron Technology CMOS Image Sensors

Investigation of CMOS Image Sensor Dark Current Reduction by Optimizing Interface Defect

Scene-based nonuniformity compensation for imaging sensors

A Non-Linear Temperature Compensation Model for Improving the Measurement Accuracy of an Inductive Proximity Sensor and Its Application-Specific Integrated Circuit Implementation

Temporal Noise Analysis of Charge-Domain Sampling Readout Circuits for CMOS Image Sensors

Nonuniformity Compensation For Ir Focal Plane Array Sensors

Noise Improvement and High Dynamic Range in a CMOS Image Sensor With Shift Biasing Structure

All CMOS Temperature, Supply Voltage and Process Independent Current Reference