A CMOS SPAD Sensor With a Multi-Event Folded Flash Time-to-Digital Converter for Ultra-Fast Optical Transient Capture

Tarek Al Abbas,Neale A. W. Dutton,Oscar Almer,Neil Finlayson,Francescopaolo Mattioli Della Rocca,Robert Henderson,Neale A.W. Dutton
DOI: https://doi.org/10.1109/jsen.2018.2803087
IF: 4.3
2018-04-15
IEEE Sensors Journal
Abstract:A digital silicon photomultiplier in 130-nm CMOS imaging technology implements time-correlated single photon counting at an order of magnitude beyond the conventional pile-up limit. The sensor comprises a 32 × 32 43% fill-factor single photon avalanche diode array with a multi-event folded-flash time-to-digital converter architecture operating at 10 GS/s. 264 bins × 16 bit histograms are generated and read out from the chip at a maximal 188 kHz enabling fast time resolved scanning or ultrafast low-light event capture. Full optical and electrical characterization results are presented.
engineering, electrical & electronic,instruments & instrumentation,physics, applied
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