Abstract:A novel scanning near‐field optical dilatometer is presented, which is contactless and capable of generating maps of both positive and negative thermal expansion coefficients of 2D materials and nanostructured thin‐films at the nanoscale. This dilatometer is based on super‐resolution scanning near‐field optical microscopy (SNOM) and, therefore, has resolution well beyond the diffraction limit of light, even if it is all‐optical in nature. To date, there are very few experimental techniques, if any, that are suitable for the purpose of acquiring quantitative maps of the thermal expansivity of 2D materials and nanostructured thin films with nanoscale lateral resolution in spite of huge demand for nanoscale thermal management, for example in designing integrated circuitry for power electronics. Besides, contactless analytical tools for determining the thermal expansion coefficient (TEC) are highly desirable because probes in contact with the sample significantly perturb any thermal measurements. Here, ω‐2ω near‐field thermoreflectance imaging is presented as a novel, all‐optical, and contactless technique to map the TEC at the nanoscale with precision. Testing of this technique is performed on nanogranular films of gold and multilayer graphene (ML‐G) platelets. With ω‐2ω near‐field thermoreflectance, it is demonstrated that the TEC of Au is higher at the metal‐insulator interface, with an average of (17.12 ± 2.30) ×10−6 K−1 in agreement with macroscopic techniques. For ML‐G, the average TEC is (−5.77 ± 3.79) x10−6 K−1 and is assigned to in‐plane vibrational bending modes. A vibrational‐thermal transition from graphene to graphite is observed, where the TEC becomes positive as the ML thickness increases. The nanoscale method here reported demonstrates results in excellent agreement with its macroscopic counterparts, as well as superior capabilities to probe 2D materials and interfaces.

A uniaxial stress capacitive dilatometer for high-resolution thermal expansion and magnetostriction under multiextreme conditions

A uniaxial stress capacitive dilatometer for high-resolution thermal expansion and magnetostriction under multiextreme conditions

New applications for the world's smallest high-precision capacitance dilatometer and its stress-implementing counterpart

Thermal expansion and magnetostriction measurements using a Quantum Design Physical Property Measurement System

Three terminal capacitance technique for magnetostriction and thermal expansion measurements

Thermal Expansion and Magnetostriction Measurements at Cryogenic Temperature Using the Strain Gauge Method

A High Resolution Dilatometer Using Optical Fiber Interferometer

A temperature-modulated dilatometer by using a piezobender-based device

Setup of high resolution thermal expansion measurements in closed cycle cryostats using capacitive dilatometers

Low-temperature and high magnetic field dynamic scanning capacitance microscope

Contactless Scanning Near‐Field Optical Dilatometry Imaging at the Nanoscale

Speed of electronic phase propagation in revealed by dilatometry

Compact computer controlled biaxial tensile device for low-temperature transport measurements of layered materials

A universal platform for magnetostriction measurements in thin films

A contactless scanning near-field optical dilatometer imaging the thermal expansivity of inhomogeneous 2D materials and thin films at the nanoscale

Measurement of the angle dependence of magnetostriction in pulsed magnetic fields using a piezoelectric strain gauge

Magnetostriction measurements at milli-kelvin temperatures using a Fabry–Pérot interferometer

A compact ultrahigh vacuum scanning tunneling microscope with dilution refrigeration

Capacitive detection of magnetostriction, dielectric constant, and magneto-caloric effects in pulsed magnetic fields

Experimental device for measuring the influence of a uniaxial stress on specific heat: Application to the strontium titanate ferroelastic crystal

Piezoelectric-based apparatus for strain tuning