Abstract:We introduce a high performance differential dilatometer based on an all-fiber Michelson interferometer at cryogenic temperature with $10^{-10}$ resolution in $\delta L/L$. It resolve the linear thermal expansion coefficient by measuring the oscillating changes of sample thickness and sample temperature with the interferometer and in-situ thermometer, respectively. By measuring the linear thermal expansion coefficient $\alpha$ near the antiferromagnetic transition region of BaFe$_2$As$_2$ as a demonstration, we show our dilatometer is able to measure thin samples with sub-pm-level length change resolution and mK-level temperature resolution. Despite there is residual background thermal expansion of a few nm/K in measurement result, our new dilatometer is sitll a powerful tool for study of phase transition in condensed matter physics, especially significant advantages in fragile materials with sub-100$\mu$m thickness and being integrated with multiple synchronous measurements and tuning thanks to the extremely high resolution and contactless nature. The prototype design of this setup can be further improved in many aspects for specific applications.

What problem does this paper attempt to address?

The problem that this paper attempts to solve is to develop a high - resolution differential dilatometer for accurately measuring the linear thermal expansion coefficient ($\alpha$) of materials in a low - temperature environment. Specifically, this research aims to achieve high - precision measurement of sample length change ($\delta L$) and temperature change ($\delta T$) by using an all - fiber Michelson interferometer. This new - type dilatometer has the following features: 1. **Extremely high resolution**: It can measure length changes at the sub - picometer (sub - pm) level and temperature changes at the millikelvin (mK) level. 2. **Contact - free measurement**: It adopts a non - contact optical method, avoiding potential damage to fragile samples caused by traditional contact - type measurement. 3. **Suitable for thin samples**: It is especially suitable for thin samples with a thickness of less than 100 micrometers. 4. **Multiple synchronous measurements**: It can be combined with other synchronous measurements (such as transport property measurements), and regulatory means such as strain or electric field can be applied in - situ. ### Specific problem description This paper mainly solves the following key problems: - **Improving measurement accuracy**: By introducing an all - fiber Michelson interferometer, an ultra - high - resolution measurement of sample length change ($\delta L/L\sim10^{- 10}$) is achieved, and high stability can be maintained in a low - temperature environment. - **Reducing background noise**: Through a carefully designed structure and temperature control system, the background thermal expansion interference from the sample holder and other components is effectively reduced, making the measurement results more accurate. - **Studying phase - transition phenomena**: By measuring the thermal expansion coefficient of the iron - based superconductor BaFe$_2$As$_2$, the application potential of this dilatometer in studying phase - transition phenomena in condensed - matter physics is demonstrated, especially in the vicinity of the antiferromagnetic transition region. ### Main contributions The main contribution of this research lies in providing a brand - new, high - resolution dilatometer design scheme, which is especially suitable for studying the thermal expansion behavior of low - dimensional materials and fragile samples. This instrument can not only detect subtle phase - transition features, but also perform stable and reliable measurements under extreme conditions (such as extremely low temperatures), providing a powerful tool for condensed - matter physics research.

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