Review and Novel Formulae for Transmittance and Reflectance of Wedged Thin Films on absorbing Substrates

Manuel Ballester,Emilio Marquez,John Bass,Christoph Wuersch,Florian Willomitzer,Aggelos K. Katsaggelos

2024-09-04

Abstract:Historically, spectroscopic techniques have been essential for studying the optical properties of thin solid films. However, existing formulae for both normal transmission and reflection spectroscopy often rely on simplified theoretical assumptions, which may not accurately align with real-world conditions. For instance, it is common to assume (1) that the thin solid layers are deposited on completely transparent thick substrates and (2) that the film surface forms a specular plane with a relatively small wedge angle. While recent studies have addressed these assumptions separately, this work presents an integrated framework that eliminates both assumptions simultaneously. In addition, the current work presents a deep review of various formulae from the literature, each with their corresponding levels of complexity. Our review analysis highlights a critical trade-off between computational complexity and expression accuracy, where the newly developed formulae offer enhanced accuracy at the expense of increased computational time. Our user-friendly code, which includes several classical transmittance and reflectance formulae from the literature and our newly proposed expressions, is publicly available in both Python and Matlab at this link.

Materials Science,Computational Physics,Optics

What problem does this paper attempt to address?

The problem that this paper attempts to solve is the limitations of existing transmission and reflection spectroscopy formulas in practical applications. Specifically, traditional formulas usually rely on simplified theoretical assumptions, which may not be in line with real - world conditions, thus affecting the accuracy of measurement. The main problems include:

1. **Substrate Transparency Assumption**: Traditional methods usually assume that the thin film is deposited on a completely transparent thick substrate, which ignores the absorption characteristics that the substrate material may have within a specific wavelength range.

2. **Wedge Angle Assumption**: Traditional methods also assume that the thin - film surface is a mirror surface with a small wedge angle, which ignores the influence of complex surface geometries on the measurement results.

To overcome these problems, this paper proposes an integrated framework while eliminating the above two assumptions. By introducing new transmission and reflection formulas, the author aims to improve the accuracy of optical measurements, although this may increase computational complexity. In addition, this paper also conducts an in - depth review of various formulas in the existing literature and analyzes the trade - off between their complexity and accuracy.

### Formula Summary

The newly proposed formulas can more accurately describe the transmission and reflection characteristics of thin films on absorptive substrates. The following are the key formulas and their explanations:

- **Complex Refractive Index**:
\[
n(z)=\sqrt{\epsilon_r}=n(z)+i\kappa(z)
\]
where \(n\) is the real part of the refractive index, and \(\kappa\) is the extinction coefficient (or attenuation coefficient), representing the absorption characteristics of the medium.

- **Phase Delay and Absorption Coefficient**:
\[
\alpha_1 = \frac{4\pi}{\lambda_0}\kappa_1
\]
\[
\phi_1=\frac{2\pi}{\lambda_0}n_1d
\]
\[
\delta_1 = 2\phi_1
\]
where \(\alpha_1\) is the absorption coefficient, \(\phi_1\) is the phase delay, and \(\delta_1\) is a round - trip phase delay.

- **Total Transmittance and Reflectance**:
\[
T=\left|\frac{1}{M(1,1)}\right|^2=\frac{h}{a + 2b\cos\delta_2+2c\sin\delta_2}
\]
\[
R=\left|\frac{M(1,2)}{M(1,1)}\right|^2=\frac{\eta}{\tau}=\frac{e + 2f\cos\delta_2+2g\sin\delta_2}{a + 2b\cos\delta_2+2c\sin\delta_2}
\]

These formulas take into account the effects of substrate absorption and wedge angle, thereby improving the accuracy of optical measurements.