Abstract:Control of crystallography of metal electrodeposit films has recently emerged as a key to achieving long operating lifetimes in next-generation batteries. It is reported that the large crystallographic heterogeneity, e.g., broad orientational distribution, that appears characteristic of commercial metal foils, results in rough morphology upon plating/stripping. On this basis, an accumulative roll bonding (ARB) methodology-a severe plastic deformation process-is developed. Zn metal is used as a first example to interrogate the concept. It is demonstrated that the ARB process is highly effective in achieving uniform crystallographic control on macroscopic materials. After the ARB process, the Zn grains exhibit a strong (002) texture (i.e., [002]Zn //ND). The texture transitions from a classical bipolar pattern to a nonclassical unipolar pattern under large nominal strain eliminate the orientational heterogeneity of the foil. The strongly (002)-textured Zn remarkably improves the plating/stripping performance by nearly two orders of magnitude under practical conditions. The performance improvements are readily scaled to achieve pouch-type full batteries that deliver exceptional reversibility. The ARB process can, in principle, be applied to any metal chemistry to achieve similar crystallographic uniformity, provided the appropriate temperature and accumulated strains are employed. This concept is evaluated using commercial Li and Na foils, which, unlike Zn (HCP), are BCC crystals. The simple process for creating strong textures in both hexagonal and cubic metals and illustrating the critical role such built-in crystallography plays underscores opportunities for developing highly reversible thin metal anodes (e.g., hexagonal Zn, Mg, and cubic Li, Na, Ca, Al).

Determining the Preferred Orientation of Silver-Plating via X-ray Diffraction Profile

Characterization of Preferred Orientation of Silver Film on Copper Substrates by X-Ray Diffraction

Quantitative Analysis of a Textured Coating by a New X-Ray Diffraction Method

Crystallographic Orientation Dependence of Dielectric Response in Lead Strontium Titanate Thin Films

A XRD Method to Measure Orientation of Single Crystal Superalloys

Determination of three-dimensional orientations of ferroelectric single crystals by an improved rotating orientation x-ray diffraction method.

Structural Domain Imaging and Direct Determination of Crystallographic Orientation in Noncentrosymmetric Ca3Ru2O7Using Polarized Light Reflectance*

Characterization of Fiber Texture by Omega-Scan X-Ray Diffraction

Crystallographic Orientation Analysis of Nanocrystalline Tungsten Thin Film Using TEM Precession Electron Diffraction and SEM Transmission Kikuchi Diffraction

Application of XRD ω-scan Technique in Determining the Texture of Ni-Fe Alloy Coatings

Applications Of The Rotating Orientation Xrd Method To Oriented Materials

Identification of preferentially exposed crystal facets by X-ray diffraction

X-ray Diffraction Measurement of Residual Stress and Crystal Orientation in Au/NiCr/Ta Films Prepared by Plating

QUANTITATIVE ANALYSIS OF TEXTURE CHANGE IN THIN SILVER FILMS

Textured Electrodes: Manipulating Built-In Crystallographic Heterogeneity of Metal Electrodes via Severe Plastic Deformation

Systematical Analysis on the Grain Orientation Evolution of Pure Nickel under Plastic Deformation by Using In-Situ EBSD

Combined Texture and Microstructure Analysis of Deformed Crystals by High-Energy X-ray Diffraction

A Method for Accurate Orientation Determination for Rotation Electron Diffraction Patterns

Direct structure depth profiling of polycrystalline thin films by X-ray diffraction and its application

Analysis on preferred orientation and purity estimation of Ti3SiC2

Characterization of Polycrystalline Gradient Thin Film by X-ray Diffraction Method