Identification of preferentially exposed crystal facets by X-ray diffraction

Liping Zhang,Alexandre A. S. Gonçalves,Mietek Jaroniec

DOI: https://doi.org/10.1039/d0ra00769b

IF: 4.036

2020-01-01

RSC Advances

Abstract:Intensification of X-ray diffraction peaks can be used to get information about doping, presence of vacancies, anisotropic nanostructures, or preferred orientation of crystals with largely exposed facets.

chemistry, multidisciplinary

What problem does this paper attempt to address?

The Revolutionary Multigrain Crystallography Method for High-Pressure X-ray Diffraction

Mao Ho-kwang,Zhang Li

2015-01-01

Abstract:For a century, x-ray crystallography has been conducted with one of the two extreme sample conditions: either a single crystal which produces a single set of diffraction spots directly corresponding to the geometric orientation of the crystal, or a powder sample which comprises a huge number of crystals so numerous that the diffraction spots overlap and merge into smooth rings while the geometric relation is completely lost and only the d-spacings information of diffraction planes is observed. High-pressure DAC is not optimized for either condition. Powder x-ray diffraction has the intrinsic limitations when the sample consists of multiple different phases with low symmetry. Diffraction rings cover most of the detector area, and only a couple of low angle diffraction rings are unique to a phase; most other rings overlap with one another and cannot be used for unique identiﬁcation or accurate determination of crystallographic parameters. New structures and minor phases are often overshadowed by the diffraction of major phases and are impossible to ﬁnd or identify. Advanced crystallographic software, such as Rietveld and LeBail reﬁnement methods, may get most out of a powder pattern, but cannot overcome the intrinsic limitations. In addition, the common practice of integrating the 2D ring into a 1D peak plot throws away the valuable information of a whole dimension, such as the azimuthal angle of diffraction spot around the ring. Single-crystal XRD contains orientation and geometrical relationship in addition to d-spacings and thus provides a deﬁnitive characterization of the unit cell and symmetry. Unless the crystal is orientated exactly relative to the incident monochromatic x-ray beam to satisfy the Bragg relation, the crystal gives no signal, and the detector remains empty. Rotating the crystal around the w-axis (perpendicular to the incident x-ray beam) can bring the crystal to Bragg condition and occasionally obtain single diffraction spots at a given angle and scanning step. In spite of the advantages, single crystal cannot be sustained through phase transitions and often breaks down into multiple crystals and generate spotty XRD patterns. Spottiness, that is generally regarded as a ﬂaw in powder XRD, can be turned into great advantages if we can separate individual crystallites and handle them as individual single crystals. The high-brilliance x-ray beam available at synchrotron facilities has made it possible to collect diffraction spots in a powder sample comprised of up to hundreds of submicron crystallites. The newly developed Multigrain Crystallography (MGC) package, which is a suite of programs used for processing and indexing diffraction spots, has been developed to separate and identify the crystallographic orientation of each individual crystallite in the aggregate of hundreds of crystallites. Once separated, the data set for each crystallite can be handled with the standard single-crystal reﬁnement program identical to a stand-alone single crystal, resulting in excellent statistics in reﬁnement and full coverage of the reciprocal space. The MGC method is very powerful in unequivocal determination of symmetry and unit cells, testing different indexing models, picking out minor phases, and resolving strain of individual crystallites, and will very likely replace the powder and single-crystal x-ray diffraction methods as the dominant crystallographic tool for future high pressure-temperature studies in DAC.
Artifact identification in X‐ray diffraction data using machine learning methods

Howard Yanxon,James Weng,Hannah Parraga,Wenqian Xu,Uta Ruett,Nicholas Schwarz

DOI: https://doi.org/10.1107/S1600577522011274

IF: 2.557

2022-12-11

Journal of Synchrotron Radiation

Abstract:The capability of machine learning methods for identifying and separating artifacts that appear in a typical X‐ray diffraction image is demonstrated.In situ synchrotron high‐energy X‐ray powder diffraction (XRD) is highly utilized by researchers to analyze the crystallographic structures of materials in functional devices (e.g. battery materials) or in complex sample environments (e.g. diamond anvil cells or syntheses reactors). An atomic structure of a material can be identified by its diffraction pattern along with a detailed analysis of the Rietveld refinement which yields rich information on the structure and the material, such as crystallite size, microstrain and defects. For in situ experiments, a series of XRD images is usually collected on the same sample under different conditions (e.g. adiabatic conditions) yielding different states of matter, or is simply collected continuously as a function of time to track the change of a sample during a chemical or physical process. In situ experiments are usually performed with area detectors and collect images composed of diffraction patterns. For an ideal powder, the diffraction pattern should be a series of concentric Debye–Scherrer rings with evenly distributed intensities in each ring. For a realistic sample, one may observe different characteristics other than the typical ring pattern, such as textures or preferred orientations and single‐crystal diffraction spots. Textures or preferred orientations usually have several parts of a ring that are more intense than the rest, whereas single‐crystal diffraction spots are localized intense spots owing to diffraction of large crystals, typically >10 μm. In this work, an investigation of machine learning methods is presented for fast and reliable identification and separation of the single‐crystal diffraction spots in XRD images. The exclusion of artifacts during an XRD image integration process allows a precise analysis of the powder diffraction rings of interest. When it is trained with small subsets of highly diverse datasets, the gradient boosting method can consistently produce high‐accuracy results. The method dramatically decreases the amount of time spent identifying and separating single‐crystal diffraction spots in comparison with the conventional method.

optics,physics, applied,instruments & instrumentation
Application of laboratory micro X-ray fluorescence devices for X-ray topography

Christo Guguschev,Christian Hirschle,Kaspars Dadzis,Albert Kwasniewski,Michael Schulze,Leonard Schellkopf,Carsten Richter

DOI: https://doi.org/10.1107/S1600576724003509

2024-05-17

Abstract:It is demonstrated that high-resolution energy-dispersive X-ray fluorescence mapping devices based on a micro-focused beam are not restricted to high-speed analyses of element distributions or to the detection of different grains, twins and subgrains in crystalline materials but can also be used for the detection of dislocations in high-quality single crystals. Si single crystals with low dislocation densities were selected as model materials to visualize the position of dis-locations by the spatially resolved measurement of Bragg-peak intensity fluctuations. These originate from the most distorted planes caused by the stress fields of dislocations. The results obtained by this approach are compared with laboratory-based Lang X-ray topographs. The presented methodology yields comparable results and it is of particular interest in the field of crystal growth, where fast chemical and microstructural characterization feedback loops are indispensable for short and efficient development times. The beam divergence was reduced via an aperture management system to facilitate the visualization of dislocations for virtually as-grown, non-polished and non-planar samples with a very pronounced surface profile.
Determining the Preferred Orientation of Silver-Plating via X-ray Diffraction Profile

Taotao Li,Liuwei Zheng,Wanggang Zhang,Pengfei Zhu

DOI: https://doi.org/10.3390/nano11092417

IF: 5.3

2021-09-17

Nanomaterials

Abstract:Determining the preferred orientation of plating film is of practical importance. In this work, the Rietveld method and quantitative texture analysis (RM+QTA) are used to analyze the preferred orientation of plating silver film with XRD profile, whose axial texture can be completely described by a set of exponential harmonics index, extracted from a single XRD profile, C41,1(0.609), C61,1(0.278), C81,1(−0.970). The constructed pole figures with the index of the exponential harmonic are following those measured by the multi-axis diffractometer. The method using exponential harmonic index can be extended to characterize the plating by electroplating in a quantitative harmonic description. In addition, a new dimension involving crystallite shape and size is considered in characterizing the preferred orientation.

materials science, multidisciplinary,physics, applied,nanoscience & nanotechnology,chemistry
Distinguishing Faceted Oxide Nanocrystals with 17O Solid-State NMR Spectroscopy

Yuhong Li,Xin-Ping Wu,Ningxin Jiang,Ming Lin,Li Shen,Haicheng Sun,Yongzheng Wang,Meng Wang,Xiaokang Ke,Zhiwu Yu,Fei Gao,Lin Dong,Xuefeng Guo,Wenhua Hou,Weiping Ding,Xue-Qing Gong,Clare P. Grey,Luming Peng

DOI: https://doi.org/10.1038/s41467-017-00603-7

2018-01-01

Acta Physico-Chimica Sinica

Abstract:Facet engineering of oxide nanocrystals represents a powerful method for generating diverse properties for practical and innovative applications. Therefore, it is crucial to determine the nature of the exposed facets of oxides in order to develop the facet/morphology–property relationships and rationally design nanostructures with desired properties. Despite the extensive applications of electron microscopy for visualizing the facet structure of nanocrystals, the volumes sampled by such techniques are very small and may not be representative of the whole sample. Here, we develop a convenient 17 O nuclear magnetic resonance (NMR) strategy to distinguish oxide nanocrystals exposing different facets. In combination with density functional theory calculations, we show that the oxygen ions on the exposed (001) and (101) facets of anatase titania nanocrystals have distinct 17 O NMR shifts, which are sensitive to surface reconstruction and the nature of the steps on the surface. The results presented here open up methods for characterizing faceted nanocrystalline oxides and related materials.
Method for Identifying Crystalline Phases in X-ray Diffraction Data from Multiphase Samples

A.D. Skorbun,S.V. Gabielkov,I.V. Zhyganiuk

DOI: https://doi.org/10.48550/arXiv.2108.07176

2021-08-06

Abstract:A new method for identifying crystalline phases in X-ray diffraction data has been proposed, which is especially useful for the study of multiphase materials (more than eight - ten phases) with a relatively low content (less than 1 - 3 wt\%). The method is based on a statistical analysis of data and provides an unambiguous non-quantitative criterion for the presence of one or another phase in the material. It has been shown that the method works reliably in cases where a significant number of reflexes (more than several dozen) on the diffraction pattern are comparable with intensity-to-noise ratio.

Materials Science
Simulations of x-ray diffraction from uniaxially-compressed highly-textured polycrystalline targets

David McGonegle,Despina Milathianaki,Bruce A. Remington,Justin S. Wark,Andrew Higginbotham

DOI: https://doi.org/10.1063/1.4927275

2015-01-27

Abstract:A growing number of shock compression experiments, especially those involving laser compression, are taking advantage of in situ x-ray diffraction as a tool to interrogate structure and microstructure evolution. Although these experiments are becoming increasingly sophisticated, there has been little work on exploiting the textured nature of polycrystalline targets to gain information on sample response. Here, we describe how to generate simulated x-ray diffraction patterns from materials with an arbitrary texture function subject to a general deformation gradient. We will present simulations of Debye-Scherrer x-ray diffraction from highly textured polycrystalline targets that have been subjected to uniaxial compression, as may occur under planar shock conditions. In particular, we study samples with a fibre texture, and find that the azimuthal dependence of the diffraction patterns contains information that, in principle, affords discrimination between a number of similar shock-deformation mechanisms. For certain cases we compare our method with results obtained by taking the Fourier Transform of the atomic positions calculated by classical molecular dynamics simulations. Illustrative results are presented for the shock-induced $\alpha$-$\epsilon$ phase transition in iron, the $\alpha$-$\omega$ transition in titanium and deformation due to twinning in tantalum that is initially preferentially textured along [001] and [011]. The simulations are relevant to experiments that can now be performed using 4th generation light sources, where single-shot x-ray diffraction patterns from crystals compressed via laser-ablation can be obtained on timescales shorter than a phonon period.

Materials Science
Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction

Sangwon Lee,Tracy D. Berman,Can Yildirim,Carsten Detlefs,John E. Allison,Ashley Bucsek

DOI: https://doi.org/10.1038/s41598-024-56546-9

IF: 4.6

2024-03-15

Scientific Reports

Abstract:Dark-field X-ray microscopy (DFXM) is a high-resolution, X-ray-based diffraction microstructure imaging technique that uses an objective lens aligned with the diffracted beam to magnify a single Bragg reflection. DFXM can be used to spatially resolve local variations in elastic strain and orientation inside embedded crystals with high spatial (~ 60 nm) and angular (~ 0.001°) resolution. However, as with many high-resolution imaging techniques, there is a trade-off between resolution and field of view, and it is often desirable to enrich DFXM observations by combining it with a larger field-of-view technique. Here, we combine DFXM with high-resolution X-ray diffraction (HR-XRD) applied to an in-situ investigation of static recrystallization in an 80% hot-compressed Mg–3.2Zn–0.1Ca wt.% (ZX30) alloy. Using HR-XRD, we track the relative grain volume of > 8000 sub-surface grains during annealing in situ. Then, at several points during the annealing process, we "zoom in" to individual grains using DFXM. This combination of HR-XRD and DFXM enables multiscale characterization, used here to study why particular grains grow to consume a large volume fraction of the annealed microstructure. This technique pairing is particularly useful for small and/or highly deformed grains that are often difficult to resolve using more standard diffraction microstructure imaging techniques.

multidisciplinary sciences
Review on the Application of X-ray Diffraction in Gem Identification, Synthesis and Crystal Structure Research

Ni ZHANG,Chun-ming LIN

DOI: https://doi.org/10.15898/j.cnki.11-2131/td.2016.03.002

2016-01-01

Abstract:Due to the nondestructive requirements of gem testing,evaluation of precious stones shows characteristics of science and uncertainty.Gemological application of X-ray Diffraction (XRD)is specialized,with its application mainly concentrated in three aspects:① Gemstone identification:phase identification of the monocrystalline gemstones and polycrystalline gemstones;origin of the gemstones;classification of the pleomorphic gem minerals.For example,according to the XRD patterns of microcrystalline cryptocrystalline quartz variants,different silica mineral phases of the chalcedony can be distinguished accurately;types of ‘Di’in bloodstone can be distinguished through the composition and content of clay mineral.②Research on crystal structure of the gem minerals:analysis of crystal chemistry of the monocrystalline gems with complex composition;situation of the substitution of mineral isomorphism;quality of the gem by using the degree of crystallinity.For example,through the c/a ratio in lattice parameters of beryl,aluminium octahedral isomorphism and the beryllium tetrahedral isomorphism can be distinguished.The relationship between the crystallinity calculated from XRD data and the quality of nephrite is close.③Development of gemological research technology:to monitor the process of gemstone optimization;to inspect the mineral crystal size, crystalline quality and internal stress during the synthetic process of gemstones;to research the artificial breeding technology based on the crystal structure of organic gemstones.Take the heat treatment process of spinel as example:magnesium irons moved from octahedral M—O to tetrahedral T—O,resulting in the bond length of M—O and T—O changing upon temperature and being reflected in the spinel color.During the synthesis process of topaz,XRD data shows that the structure of the formed fluorine topaz is similar to natural topaz at 770 -800℃.At 950℃ and 1000℃, the fluorine topaz is decomposed to corundum and mullite.XRD research in the gemological application began relatively recently in China.In other countries,application in gem identification,optimization and synthesis are relatively mature.There is still much room for the development of XRD when combined with other technologies such as the Scanning Electron Microscope and Proton Microprobe.
A tunable multi-color "rainbow" filter for improved stress and dislocation density field mapping in polycrystals using x-ray Laue microdiffraction

Odile Robach,Jean-Sébastien Micha,Olivier Ulrich,Olivier Geaymond,Olivier Sicardy,Jürgen Härtwig,François Rieutord

DOI: https://doi.org/10.48550/arXiv.1207.2868

2012-12-19

Abstract:White beam x-ray Laue microdiffraction allows fast mapping of crystal orientation and strain fields in polycrystals, with a submicron spatial resolution in two dimensions. In the well crystallized parts of the grains, the analysis of Laue spot positions provides the local deviatoric strain tensor. The hydrostatic part of the strain tensor may also be obtained, at the cost of a longer measuring time, by measuring the energy profiles of the Laue spots using a variable-energy monochromatic beam. A new "Rainbow" method is presented, which allows measuring the energy profiles of the Laue spots while remaining in the white-beam mode. It offers mostly the same information as the latter monochromatic method, but with two advantages : i) the simultaneous measurement of the energy profiles and the Laue pattern; ii) the rapid access to energy profiles of a larger number of spots, for equivalent scans on the angle of the optical element. The method proceeds in the opposite way compared to a monochromator-based method, by simultaneously removing several sharp energy bands from the incident beam, instead of selecting a single one. It uses a diamond single crystal placed upstream of the sample. Each Laue diffraction by diamond lattice planes attenuates the corresponding energy in the incident spectrum. By rotating the crystal, the filtered-out energies can be varied in a controlled manner, allowing one to determine the extinction energies of several Laue spots of the studied sample. The energies filtered-out by the diamond crystal are obtained by measuring its Laue pattern with an other 2D detector, at each rotation step. This article demonstrates the feasibility of the method, and its validation through the measurement of a known lattice parameter.

Materials Science
Application of scanning electron diffraction in the transmission electron microscope for the characterisation of dislocations in minerals

Billy C. Nzogang,Alexandre Mussi,Patrick Cordier

DOI: https://doi.org/10.1180/mgm.2018.144

2018-07-30

Mineralogical Magazine

Abstract:Abstract We present an application of scanning electron diffraction for the characterisation of crystal defects in olivine, quartz and phase A (a high pressure hydrated phase). In this mode, which takes advantage of the ASTARTM module from NanoMEGAS, a slightly convergent probe is scanned over the sample with a short acquisition time (a few tens of ms) and the spot patterns are acquired and stored for further post-processing. Originally, orientation maps were constructed from automatic indexing at each probe location. Here we present another application where images are reconstructed from the intensity of diffraction spots, producing either so-called ‘virtual’ bright- or dark-field images. We show that these images present all the characteristics of contrast (perfect crystal or defects) of conventional transmission electron microscopy images. Data are acquired with a very short time per probe location (a few tens of milliseconds), this technique appears very attractive for the characterisation of beam-sensitive materials. However, as the acquisition is done at a given orientation, fine tuning of the diffraction conditions at a given location for each reflection is not possible. This might present a difficulty for some precise, quantitative contrast analysis.

mineralogy
X-Ray Diffraction: Instrumentation and Applications

Andrei A. Bunaciu,Elena gabriela Udriştioiu,Hassan Y. Aboul-Enein

DOI: https://doi.org/10.1080/10408347.2014.949616

2015-04-01

Critical Reviews in Analytical Chemistry

Abstract:X-ray diffraction (XRD) is a powerful nondestructive technique for characterizing crystalline materials. It provides information on structures, phases, preferred crystal orientations (texture), and other structural parameters, such as average grain size, crystallinity, strain, and crystal defects. X-ray diffraction peaks are produced by constructive interference of a monochromatic beam of X-rays scattered at specific angles from each set of lattice planes in a sample. The peak intensities are determined by the distribution of atoms within the lattice. Consequently, the X-ray diffraction pattern is the fingerprint of periodic atomic arrangements in a given material. This review summarizes the scientific trends associated with the rapid development of the technique of X-ray diffraction over the past five years pertaining to the fields of pharmaceuticals, forensic science, geological applications, microelectronics, and glass manufacturing, as well as in corrosion analysis.

chemistry, analytical
Diffraction imaging for in-situ characterization of double-crystal x-ray monochromators

Stanislav Stoupin,Zunping Liu,Steve M. Heald,Dale Brewe,Mati Meron

DOI: https://doi.org/10.1107/S1600576715017446

2015-09-17

Abstract:Imaging of the Bragg reflected x-ray beam is proposed and validated as an in-situ method for characterization of performance of double-crystal monochromators under the heat load of intense synchrotron radiation. A sequence of images is collected at different angular positions on the reflectivity curve of the second crystal and analyzed. The method provides rapid evaluation of the wavefront of the exit beam, which relates to local misorientation of the crystal planes along the beam footprint on the thermally distorted first crystal. The measured misorientation can be directly compared to results of finite element analysis. The imaging method offers an additional insight on the local intrinsic crystal quality over the footprint of the incident x-ray beam.

Optics
A XRD Method to Measure Orientation of Single Crystal Superalloys

Zhao Xinbao,Liu Lin,Yu Zhuhuan,Liu Gang,Fu Hengzhi

DOI: https://doi.org/10.3321/j.issn:1002-185X.2009.07.035

2009-01-01

Rare Metal Materials and Engineering

Abstract:A method to determine preferred orientation of Ni-base single crystal superalloys AM3 is presented by use of X-ray diffractometer. By rotating a sample along its surface axis during theta-scanning process to ensure the normal axis of the crystal plane to across the diffraction plane multiply, the relationship between the crystal plan and the surface is obtained. The credibility is discussed by comparing the results of calculation and experiments. The identification of single crystal superalloys and dispersion degree of crystal orientation are elucidated. It is found that this method is simple and accurate for identifying single crystal superalloys.
Divergent-beam X-ray photography of crystals

DOI: https://doi.org/10.1098/rsta.1947.0002

1947-03-27

Abstract:Divergent-beam X-ray photography of single crystals by transmission can be used to study the ‘extinction’, that is, the diminution of the transmitted radiation that takes place at the Bragg reflexion angles. The intensity and geometry of the absorption lines observed give useful information about the texture of the crystal. Divergent beam photographs have shown that many crystals of organic compounds are unexpectedly perfect, and that sudden cooling to liquid-air temperatures will increase the mosaic character of their structure by an important factor and make them more suitable for structural analysis by the usual methods. Type I diamonds, and natural ice even near to its melting-point, are also found to possess a high degree of perfection, which cannot be removed by liquid-air treatment. The divergent beam method may be used for the determination of orientation, but it is important that the wave-length of X-rays employed should be correctly related to the size and nature of the crystal. In certain favourable cases it is possible to make precision measurements of lattice constant or of wave-length from divergent beam photographs, without the use of any kind of precision apparatus. By such means it has been shown that the C—C distance in individual diamonds varies from 1541.53(± 0-02) to 1541.27X, (1.54465-1-54440A), a difference presumably due to varying impurity content. Using diamond and a brass anticathode, the Zn Ka 1 wave-length, relative to Cu K Ka 1 as 1537.40X, is found to be 1432.21 ( ± 0-04) X. Temperature control would improve the accuracy of this measurement, which is, however, in good agreement with the latest value obtained by orthodox precision methods.
Distinguishing and Further Reinforcement for Nanocrystal XRD Peaks Caused by Instrument Broadening in Nanomixed Materials

Chunjian Wang,Jiakun Xu,Jingmin Li,Chen He

DOI: https://doi.org/10.1142/s1793292024501662

2024-11-07

NANO

Abstract:Nano, Ahead of Print. X-ray diffraction (XRD) is one of the most essential techniques for characterizing various crystals. However, when nanocrystals are present, the diffraction peaks become significantly broadened and reduced in intensity, making phase and microstructure analysis challenging. To obtain more refined microstructural information from nanocrystals, various methods have been developed to enhance diffraction peaks, with step scanning being a commonly used approach. Additionally, increasing instrument broadening (IB) by adjusting slit sizes to enlarge the irradiation area is a convenient yet often overlooked method. In this study, the effects of IB on the diffraction peak intensities of nanocrystals and micron crystals in mixed materials were thoroughly investigated. The results show that the intensities of both nanocrystals and micron crystals increase as IB increases, a behavior similar to that observed when extending the testing time during step scanning. However, the rate of increase in peak heights for nanocrystals is higher than for micron crystals, while the rate of increase in peak width for nanocrystals is lower, which is a significant departure from the effects seen in step scanning. In other words, nanocrystal peaks become sharper and more distinct as IB increases. This phenomenon is explained by the different components of peak width for nanocrystals and micron crystals, based on Lorentz mathematical model analysis. Based on these findings, it is recommended to utilize larger IBs in combination with step scanning to further reinforce nanocrystal peaks in mixed materials.

materials science, multidisciplinary,physics, applied,nanoscience & nanotechnology
Microsymposium MS004.O04 Accurate determination of crystal orientation from rotation electron diffraction data

Bin Wang,Sven Hovmöller,Xiaodong Zou,Wei Wan

2017-01-01

Abstract:Electron crystallography can overcome the limitation of X-ray crystallography on crystal size, which is a few microns for modern synchrotron sources, and allow the structures of crystals down to nanometer sizes to be studied. Rotation electron diffraction (RED) was thus developed with the aim of accurate determination of 3D atomic structures of crystals of submicrometer sizes [1]. RED has been shown to be powerful in phase identification and structure determination [2]. In RED data collection, electron beam tilt and goniometer tilt are combined to rotate the crystal in a large range (typically 100 – 140 degrees) with a small step (0.1 ~ 0.2 degrees) and electron diffraction (ED) frames are collected for each tilt. In RED data processing, 3D reciprocal lattice of the crystal is reconstructed from the 2D ED patterns. The unit cell parameters are determined, and after indexing the diffraction intensities are output for structure determination and refinement. Accurate orientation of the crystal is important for diffraction intensity integration and structure refinement from 3D electron diffraction data using dynamical theories [3]. Although the orientation matrix is determined after reciprocal lattice is reconstructed in RED data processing, possible errors in the goniometer angles lead to inaccurate determination of the crystal orientation. In this work we developed a method for determining the accurate orientations of the crystal from RED data. As the crystal remains still during electron beam tilting, its orientation only needs to be determined for individual beam tilt series. By using a fast numerical localized random search method, the orientation of each frame within one tilt series is obtained by least squares minimization of the distances from the reflections to the Ewald sphere, with the indices of the observed reflections in the frames and the unit cell dimensions as input. The accuracy of the fitted orientations was up to 0.01° versus true orientations as shown using simulated tilt series diffraction data with a tilt step of 0.1 degree. The algorithm was tested on an experimental garnet dataset and large errors in the goniometer angle readouts were identified according to the fitted results. The least squares objective function was also analyzed and discussed in connection to the accuracy of the fitting results. The orientation of the tilt axis and the unit cell dimensions can be refined by including them in the least squares objective function. The algorithm was proven to be effective for diffraction tilt series with relatively fine (~0.2°) tilt steps and good number of diffraction spots (> 25) on the frames. [1] Wan W., Sun J.L., Su J., Hovmöller S., Zou X. (2013). J. Appl. Cryst.,46, 1863-1873. [2] Yun Y.F., Zou X., Hovmöller S., Wan W. (2015). IUCrJ, 2, 267–282. [3] Palatinus L., Petricek V., Correa C.A. (2015). Acta Cryst., A71, 235-244.
Detecting rare, abnormally large grains by x-ray diffraction

B. L. Boyce,T. A. Furnish,H. A. Padilla,D. Van Campen,A. Mehta

DOI: https://doi.org/10.1007/s10853-015-9226-3

IF: 4.5

2015-07-16

Journal of Materials Science

Abstract:Bimodal grain structures are common in many alloys, arising from a number of different causes including incomplete recrystallization and abnormal grain growth. These bimodal grain structures have important technological implications, such as the well-known Goss texture which is now a cornerstone for electrical steels. Yet our ability to detect bimodal grain distributions is largely confined to brute force cross-sectional metallography. The present study presents a new method for rapid detection of unusually large grains embedded in a sea of much finer grains. Traditional X-ray diffraction-based grain size measurement techniques such as Scherrer, Williamson–Hall, or Warren–Averbach rely on peak breadth and shape to extract information regarding the average crystallite size. However, these line broadening techniques are not well suited to identify a very small fraction of abnormally large grains. The present method utilizes statistically anomalous intensity spikes in the Bragg peak to identify regions where abnormally large grains are contributing to diffraction. This needle-in-a-haystack technique is demonstrated on a nanocrystalline Ni–Fe alloy which has undergone fatigue-induced abnormal grain growth. In this demonstration, the technique readily identifies a few large grains that occupy <0.00001 % of the interrogation volume. While the technique is demonstrated in the current study on nanocrystalline metal, it would likely apply to any bimodal polycrystal including ultrafine grained and fine microcrystalline materials with sufficiently distinct bimodal grain statistics.

materials science, multidisciplinary
Structural fingerprinting in the transmission electron microscope: Overview and opportunities to implement enhanced strategies for nanocrystal identification

Peter Moeck,Philip Fraundorf

DOI: https://doi.org/10.48550/arXiv.0706.2021

2007-06-14

Abstract:This paper illustrates the prospective need for structural fingerprinting methods for nanocrystals. A review of the existing fingerprinting methods for crystal structures by means of transmission electron microscopy which work for a single setting of the specimen goniometer is given. Suggestions are made on how some of these methods could be enhanced when nanocrystals and novel instrumentation are involved, i.e. when either the kinematic or quasi-kinematic scattering approximations are sufficiently well satisfied. A novel strategy for lattice-fringe fingerprinting of nanocrystals from Fourier transforms of high-resolution phase contrast transmission electron microscopy images is briefly outlined. Nanocrystal structure specific limitations to the application of this strategy are discussed. An appeal is made to share the structural data of nanocrystals freely over the internet and infrastructure that would allow this sharing is mentioned. A shorter version of this paper has been accepted for publication in a special issue on the Structure of Nanocrystals of the Zeitschrift fuer Kristallographie, International journal for structural, physical, and chemical aspects of crystalline materials.

Materials Science
Structural Characterisation of Complex Zeolite Structures Using Electron Crystallography

Hongyi Xu,Jiho Shin,Peng Guo,Xiaodong Zou

DOI: https://doi.org/10.1107/s2053273316095097

2016-01-01

Abstract:Electron crystallography can overcome the limitation of X-ray crystallography on crystal size, which is a few microns for modern synchrotron sources, and allow the structures of crystals down to nanometer sizes to be studied.Rotation electron diffraction (RED) was thus developed with the aim of accurate determination of 3D atomic structures of crystals of sub-micrometer sizes [1-2].RED has shown to be powerful in phase identification and structure determination.More than 70 structures have been solved from the RED data [3].In RED data collection, electron beam tilt and goniometer tilt are combined to rotate the crystal in a large range (typically 100 -140 degrees) with a small step (0.1 ~ 0.2 degrees) and electron diffraction (ED) frames are collected for each tilt.In RED data processing, 3D reciprocal lattice of the crystal is reconstructed from the 2D ED patterns.The unit cell parameters are determined, and after indexing the diffraction intensities are output for structure determination and refinement.In this work we aim at improving the processing of RED data, in particular the unit cell determination.Since the orientation matrix and unit cell determination are based on the positions of diffraction peaks, accurate determination of peak positions is very important for unit cell determination.In RED, the diffraction peaks are identified and the positions are determined according to the maximum intensities of the spots in 2D and 3D.Dynamic effects due to multiple scattering of electrons are known to distort electron diffraction data and they may change the distribution of diffraction peaks, i.e., peak shapes and profiles.Accuracy of peak positions determined using the maximum intensity may be affected accordingly.Therefore we introduced an alternative method for determining the peak positions using intensity weighted coordinates, i.e. the peak coordinates are calculated as the average of the coordinates of all the pixels of the reflection with intensities above a certain threshold, weighted using the intensities.By using the new peak positions for a RED data set of garnet it was shown that the accuracy of unit cell determination was improved.

Identification of preferentially exposed crystal facets by X-ray diffraction

The Revolutionary Multigrain Crystallography Method for High-Pressure X-ray Diffraction

Artifact identification in X‐ray diffraction data using machine learning methods

Application of laboratory micro X-ray fluorescence devices for X-ray topography

Determining the Preferred Orientation of Silver-Plating via X-ray Diffraction Profile

Distinguishing Faceted Oxide Nanocrystals with 17O Solid-State NMR Spectroscopy

Method for Identifying Crystalline Phases in X-ray Diffraction Data from Multiphase Samples

Simulations of x-ray diffraction from uniaxially-compressed highly-textured polycrystalline targets

Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction

Review on the Application of X-ray Diffraction in Gem Identification, Synthesis and Crystal Structure Research

A tunable multi-color "rainbow" filter for improved stress and dislocation density field mapping in polycrystals using x-ray Laue microdiffraction

Application of scanning electron diffraction in the transmission electron microscope for the characterisation of dislocations in minerals

X-Ray Diffraction: Instrumentation and Applications

Diffraction imaging for in-situ characterization of double-crystal x-ray monochromators

A XRD Method to Measure Orientation of Single Crystal Superalloys

Divergent-beam X-ray photography of crystals

Distinguishing and Further Reinforcement for Nanocrystal XRD Peaks Caused by Instrument Broadening in Nanomixed Materials

Microsymposium MS004.O04 Accurate determination of crystal orientation from rotation electron diffraction data

Detecting rare, abnormally large grains by x-ray diffraction

Structural fingerprinting in the transmission electron microscope: Overview and opportunities to implement enhanced strategies for nanocrystal identification

Structural Characterisation of Complex Zeolite Structures Using Electron Crystallography