Abstract:Aspects of transmission electron goniometry are discussed. Combined with high resolution phase contrast transmission electron microscopy (HRTEM) and atomic resolution scanning TEM (STEM) in the atomic number contrast (Z-STEM) or the phase contrast bright field mode, transmission electron goniometry offers the opportunity to develop dedicated methods for the crystallographic characterization of nanocrystals in three dimensions. The relationship between transmission electron goniometry and electron tomography for materials science applications is briefly discussed. Internet based java applets that facilitate the application of transmission electron goniometry for cubic crystals with calibrated tilt-rotation and double-tilt specimen holders/goniometers are mentioned. The so called cubic-minimalistic tilt procedure for the determination of the lattice parameters of sub-stoichiometric WC1-x nanocrystals with halite structure is demonstrated. The freely (openly) accessible, Internet based, Crystallography Open Database (COD) is briefly discusses because the ability to determine the lattice parameters of nanocrystals opens up the possibility of identifying unknown phases by comparing these lattice constants to the entries of comprehensive databases. Correspondingly, a search of the determined lattice parameters in the COD is shown as part of a screen shot. The enhanced viability of transmission electron goniometry in TEMs (and STEMs) with aberration corrected electron optics is illustrated on the WC1-x model system.

An alternative method of image simulation in high resolution transmission electron microscopy

Imaging Simulation of Charged Nanowires in TEM with Large Defocus Distance.

Image simulation for atomic resolution secondary electron image.

Investigation of Non-Linear Imaging in High-Resolution Transmission Electron Microscopy.

Atomic Resolution Imaging of Light Elements in a Crystalline Environment using Dynamic Hollow-Cone Illumination Transmission Electron Microscopy

High-resolution transmission electron microscopy using negative spherical aberration.

A fast image simulation algorithm for scanning transmission electron microscopy

Is HRTEM Image Simulation Correct? A Premise-Free Calibration Approach

Quantitative High-Resolution Transmission Electron Microscopy of Single Atoms

Numerical correction of anti-symmetric aberrations in single HRTEM images of weakly scattering 2D-objects

Simulation Study of the Atomic Resolution Secondary Electron Imaging

On the Benefit of the Negative-Spherical-Aberration Imaging Technique for Quantitative Hrtem

An accurate multislice method for low-energy transmission electron microscopy.

Further discussion on the separation of linear and nonlinear components in HRTEM imaging

Quantitative HRTEM and its application in the study of oxide materials

Aberration-Corrected High-Resolution Transmission Electron Microscopy and Its Applications in Functional Oxides

Prospects for sub-nanometer scale imaging of optical phenomena using electron microscopy

Simulated TEM imaging of a heavily irradiated metal

Progress in Aberration-Corrected High-Resolution Transmission Electron Microscopy of Crystalline Solids

Transmission electron goniometry and its relation to electron tomography for materials science applications

Imaging built-in electric fields and light matter by Fourier-precession TEM