Abstract:Journal Article Quantum Monte Carlo Simulation for Atomic Resolution SEM/STEM Image Get access Z Ruan, Z Ruan Hefei National Laboratory for Physical Sciences at Microscale and Department of Physics, University of Science and Technology of China, 96 Jinzhai Road, Hefei, Anhui 230026, P.R. China Search for other works by this author on: Oxford Academic Google Scholar M Zhang, M Zhang Hefei National Laboratory for Physical Sciences at Microscale and Department of Physics, University of Science and Technology of China, 96 Jinzhai Road, Hefei, Anhui 230026, P.R. China Search for other works by this author on: Oxford Academic Google Scholar RG Zeng, RG Zeng Hefei National Laboratory for Physical Sciences at Microscale and Department of Physics, University of Science and Technology of China, 96 Jinzhai Road, Hefei, Anhui 230026, P.R. China Search for other works by this author on: Oxford Academic Google Scholar B Da, B Da Hefei National Laboratory for Physical Sciences at Microscale and Department of Physics, University of Science and Technology of China, 96 Jinzhai Road, Hefei, Anhui 230026, P.R. China Search for other works by this author on: Oxford Academic Google Scholar Y Ming, Y Ming School of Physics and Material Science, Anhui University, Hefei, Anhui 230601, P.R. China Search for other works by this author on: Oxford Academic Google Scholar SF Mao, SF Mao School of Nuclear Science and Technology, University of Science and Technology of China, 96 Jinzhai Road, Hefei, Anhui 230026, P.R. China Search for other works by this author on: Oxford Academic Google Scholar ZJ Ding ZJ Ding Hefei National Laboratory for Physical Sciences at Microscale and Department of Physics, University of Science and Technology of China, 96 Jinzhai Road, Hefei, Anhui 230026, P.R. China Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 20, Issue S3, 1 August 2014, Pages 30–31, https://doi.org/10.1017/S1431927614001871 Published: 27 August 2014

Simulation Study of the Atomic Resolution Secondary Electron Imaging

Monte Carlo Study of Secondary Electron Emission

Quantum-trajectory Monte Carlo method for study of electron-crystal interaction in STEM.

Secondary-electron imaging of bulk crystalline specimens in an aberration corrected STEM

Monte Carlo simulation of secondary electron images for real sample structures in scanning electron microscopy.

Monte Carlo Simulation of Secondary Electron and Backscattered Electron Images in Scanning Electron Microscopy for Specimen with Complex Geometric Structure

Quantum Monte Carlo Simulation for Atomic Resolution SEM/STEM Image

Monte Carlo simulation of absolute secondary electron yield of Cu

Theoretical Perspective of Atomic Resolution Secondary Electron Imaging

An extensive theoretical quantification of secondary electron emission from silicon

A Monte Carlo modeling of electron interaction with solids including cascade secondary electron production

Time-dependent Characteristics of Secondary Electron Emission

Theoretical Study of the Ultimate Resolution of SEM

Monte Carlo Simulation Study of Scanning Auger Electron Images

Monte Carlo Study of Backscattering and Secondary Electron Generation

Application of Monte Carlo Simulation Method to the Nano-Scale Characterization by Scanning Electron Microscopy

A Monte Carlo Simulation Study on the Image Resolution in Scanning Electron Microscopy

Direct Imaging of Electron Orbitals with a Scanning Transmission Electron Microscope

A Synthetic Semi-Empirical Physical Model of Secondary Electron Yield of Metals under E-Beam Irradiation

Study of Secondary Electron Generation and Transport in Diamond

Simulation of Electron Solid Interaction and Its Application to Quantitative-Analysis by Auger-Electron Spectroscopy