Abstract:Over the past decade, experimental microscopy and spectroscopy have made significant progress in the study of the morphological, optical, electronic and transport properties of materials. These developments include higher spatial resolution, shorter acquisition times, more efficient monochromators and electron analysers, improved contrast imaging and advancements in sample preparation techniques. These advances have driven the need for more accurate theoretical descriptions and predictions of material properties. Computer simulations based on first principles and Monte Carlo methods have emerged as a rapidly growing field for modeling the interaction of charged particles, such as electron, proton and ion beams, with various systems, such as slabs, nanostructures and crystals. This report delves into the theoretical and computational approaches to modeling the physico-chemical mechanisms that occur when charged beams interact with a medium. These mechanisms encompass single and collective electronic excitation, ionization of the target atoms and the generation of a secondary electron cascade that deposits energy into the irradiated material. We show that the combined application of ab initio methods, which are able to model the dynamics of interacting many-fermion systems, and Monte Carlo methods, which capture statistical fluctuations in energy loss mechanisms by random sampling, proves to be an optimal strategy for the accurate description of charge transport in solids. This joint quantitative approach enables the theoretical interpretation of excitation, loss and secondary electron spectra, the analysis of the chemical composition and dielectric properties of solids and contributes to our understanding of irradiation-induced damage in materials, including those of biological significance.

Monte Carlo Study of Backscattering and Secondary Electron Generation

A Simulation Study on the Flash X-Ray Spectra Spatial Distribution

Monte Carlo simulation study of electron yields from compound semiconductor materials

Secondary electron emission from gold microparticles in the transmission electron microscope: comparison of Monte Carlo simulations with experimental results

Advancements in Secondary and Backscattered Electron Energy Spectra and Yields Analysis: from Theory to Applications

Inverse Bremsstrahlung Absorption and the Evolution of Electron Distributions Accounting for Electron-Electron Collisions

A Monte Carlo investigation of secondary electron emission from solid targets: spherical symmetry versus momentum conservation within the classical binary collision model

A simplified positron elastic scattering model for Monte Carlo calculations

Monte Carlo Simulation of Electron Transport in Silicon Carbide

Numerical simulation of proton backscattering spectra in GEANT4 toolkit

Simulating the secondary electron avalanche of MCP by Geant4

Influence of Surface Roughness on Elastically Backscattered Electrons

Electromagnetic interaction models for Monte Carlo simulation of protons and alpha particles

Experiment and Monte Carlo simulation of gamma-ray backscattering from materials for nondestructive testing

Study of Secondary Electron Generation and Transport in Diamond

Monte Carlo Modeling Of Surface Excitation In Reflection Electron Energy Loss Spectroscopy Spectrum For Rough Surfaces

An extension of first principle combined Monte Carlo method to simulate secondary electron yield of anisotropic crystal Al2O3

Non-ionizing cross section of electron scattering on atoms in matter accounting for dynamical screening effect

Systematic Study of Charge Form Factors of Elastic Electron-Nucleus Scattering with the Relativistic Eikonal Approximation

Secondary electron emission and photoelectric emission with account of excited electrons' moving backward emission surface