Abstract:High-resolution transmission electron microscopy (HRTEM) images are usually not directly interpretable in terms of crystal structure due to various aberrations in the microscope lenses. Although significant progress has been made recently in the development of hardware aberration correctors, especially spherical-aberration correctors [1], the majority of transmission electron microscopes in use today are traditional ones and structure reconstruction by software methods still serves as a cost-effective alternative. Representative software methods include exit wave reconstruction using throughfocus image series [2] and contrast transfer function (CTF) correction methods using single images or image series [3]. Here we present a CTF-correction based structure reconstruction method, using throughfocus series of HRTEM images taken with a fixed focus step, in which all images in the series are corrected for CTFs and combined into a structure image. To determine the starting defocus of the series, trial defocus values in a large range are tested and CTF corrections are made to all images. The similarity of the phases of the Fourier transform between the corrected images is used as the criterion to judge whether a trial defocus value is close to the true one. The two-fold astigmatism is determined by dividing Fourier transforms into sectors and determining the defocus along different directions. As crystallographic phases are used in defocus and astigmatism determination, no amorphous areas are required in the images. On the other hand, since CTF correction is done for all pixels within the resolution limit in reciprocal space, this method works for both perfect and defect crystals. The method was applied on a 20-image focal series of Ca0.28Ba0.72Nb2O6 (P4bm, a=12.43Å, c=3.96Å). The experimental images were collected with a focus step of -26.6 Å on a JEOL-2100F transmission electron microscope equipped with field emission gun. The starting defocus of the series is determined to be -260 Å and the two-fold astigmatism is 33 Å with an azimuth angle of 13° clockwise with respect to the x-axis of the images. The reconstructed image is shown in the figure below, in which atoms appear as black dots. Not only metals but also atomic columns as light as oxygen can be seen. The present method has the advantages of automatic defocus and two-fold astigmatism determination without amorphous areas, less CTF crossover problems and improved signal-to-noise ratio as compared to CTF correction methods using single images. The method has been implemented in a user-friendly program, QFocus, which we hope may help non-TEM experts to use HRTEM images for solving their structure problems.

Investigation of Non-Linear Imaging in High-Resolution Transmission Electron Microscopy.

Exit-wave Phase Retrieval from a Single High-Resolution Transmission Electron Microscopy Image of a Weak-Phase Object

The Nonlinear Effect of Electron Transmission in Electron Tomography for Thick Specimens

High-resolution transmission electron microscopy using negative spherical aberration.

Quantitative HRTEM and its application in the study of oxide materials

Imaging Simulation of Charged Nanowires in TEM with Large Defocus Distance.

On the Benefit of the Negative-Spherical-Aberration Imaging Technique for Quantitative Hrtem

Exit wave reconstruction of a focal series of images with structural changes in high‐resolution transmission electron microscopy

Interpretable and efficient contrast in scanning transmission electron microscopy with a diffraction grating beamsplitter

High-Resolution Scanning X-ray Diffraction Microscopy

Amplitude Contrast Imaging in High-Resolution Transmission Electron Microscopy of Ferroelectric Superlattice Film

Qfocus: Structure Reconstruction from Focal Series of Hrtem Images

Atomic Resolution Imaging of Light Elements in a Crystalline Environment using Dynamic Hollow-Cone Illumination Transmission Electron Microscopy

Numerical correction of anti-symmetric aberrations in single HRTEM images of weakly scattering 2D-objects

Negative Spherical Aberration Ultrahigh-Resolution Imaging in Corrected Transmission Electron Microscopy

Phase imaging in scanning transmission electron microscopy using bright-field balanced divergency method

Transmission electron goniometry and its relation to electron tomography for materials science applications

Aberration-Corrected High-Resolution Transmission Electron Microscopy and Its Applications in Functional Oxides

Quantitative Evaluation of Focal Series in HRTEM

Optical Sectioning and Confocal Imaging and Analysis in the Transmission Electron Microscope

Interpretability of High-Resolution Transmission Electron Microscopy Images