Abstract:The interaction of a focused X-ray beam with a sample in a scanning probe experiment can provide a variety of information about the interaction volume. In many scanning probe experiments X-ray fluorescence (XRF) is supplemented with measurements of the transmitted or scattered intensity using a pixelated detector. The automated extraction of different signals from an area pixelated detector is described, in particular the methodology for extracting differential phase contrast (DPC) is demonstrated and different processing methods are compared across a range of samples. The phase shift of the transmitted X-ray beam by the sample, extracted from DPC, is also compared with ptychography measurements to provide a qualitative and quantitative comparison. While ptychography produces a superior image, DPC can offer a simple, flexible method for phase contrast imaging which can provide fast results and feedback during an experiment; furthermore, for many science problems, such as registration of XRF in a lighter matrix, DPC can provide sufficient information to meet the experimental aims. As the DPC technique is a quantitative measurement, it can be expanded to spectroscopic studies and a demonstration of DPC for spectro-microscopy measurements is presented. Where ptychography can separate the absorption and phase shifts by the sample, quantitative interpretation of a DPC image or spectro-microscopy signal can only be performed directly when absorption is negligible or where the absorption contribution is known and the contributions can be fitted.

Interpretable and efficient contrast in scanning transmission electron microscopy with a diffraction grating beamsplitter

Grating-Based X-Ray Phase Contrast Imaging With a Polycapillary Semilens

Phase imaging in scanning transmission electron microscopy using bright-field balanced divergency method

Subnanoradian X-ray phase-contrast imaging using a far-field interferometer of nanometric phase gratings

Low-dose, Simple, and Fast Grating-Based X-ray Phase-Contrast Imaging.

Iterative Phase Retrieval Algorithms for Scanning Transmission Electron Microscopy

Single-shot grating-based x-ray differential phase contrast imaging with a modified analyzer grating

Dei-Based Phase-Contrast Tomosynthetic Experiment on Biological Samples with High Resolution X-Ray Ccd Camera

Fast X-Ray Phase-Contrast Imaging Using High Resolution Detector

Phase-contrast imaging of weakly absorbing materials using hard X-rays

Probing Light Atoms at Subnanometer Resolution: Realization of Scanning Transmission Electron Microscope Holography

Retrieval of phase information from low-dose electron microscopy experiments: are we at the limit yet?

Low-dose, simple, and fast grating-based X-ray phase-contrast imaging

Differential phase contrast for quantitative imaging and spectro-microscopy at a nanoprobe beamline

Transmission electron imaging in the Delft multibeam scanning electron microscope 1

Resolving proximal nanometer objects below the diffraction limit with interferometric phase intensity nanoscopy

Reconstructing the Scattering Matrix from Scanning Electron Diffraction Measurements Alone

Centimeter-sized Objects at Micrometer Resolution: Extending Field-of-View in Wavefront Marker X-ray Phase-Contrast Tomography

X-Ray Phase Contrast and Fluorescence Nanotomography for Material Studies

In-Line Phase Contrast Imaging Using A Micro-Focus X-Ray Source

High-resolution 3D phase-contrast imaging beyond the depth of field limit via ptychographic multi-slice electron tomography