Quantitative High-Resolution Transmission Electron Microscopy of Single Atoms

B. Gamm,R. Popescu,H. Blank,R. Schneider,A. Beyer,A. Gölzhäuser,D. Gerthsen
DOI: https://doi.org/10.48550/arXiv.1009.2393
2011-09-20
Abstract:Single atoms can be considered as basic objects for electron microscopy to test the microscope performance and basic concepts for modeling of image contrast. In this work high-resolution transmission electron microscopy was applied to image single platinum atoms in an aberration-corrected transmission electron microscope. The atoms are deposited on a self-assembled monolayer substrate which induces only negligible contrast. Single-atom contrast simulations were performed on the basis of Weickenmeier-Kohl and Doyle-Turner scattering factors. Experimental and simulated intensities are in full agreement on an absolute scale.
Materials Science
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