Planar GeSn photodiode for high-detectivity photodetection at 1550 nm

Kuo-Chih Lee,Min-Xiang Lin,Hui Li,Hung-Hsiang Cheng,Greg Sun,Richard Soref,Joshua R. Hendrickson,Kuan-Ming Hung,Patrik Scajev,Arthur Medvids
DOI: https://doi.org/10.1063/5.0006711
IF: 4
2020-07-06
Applied Physics Letters
Abstract:We report an investigation of a planar GeSn p–i–n diode for a high-detectivity photodetector based on an undoped GeSn film. By fabricating n- and p-type regions on the plane of the GeSn film using the complementary metal–oxide–semiconductor technology of ion implantation, a low dark current density is revealed and attributed to the low defect density of the film and current flow suppression around the diode periphery. This yields a specific 1550-nm detectivity of ∼10<sup>10</sup> cm Hz<sup>1/2</sup> W<sup>−1</sup>, an order of magnitude higher than that of conventional vertical GeSn-based diodes and comparable to that of commercially available Ge-based diodes. This work provides an alternative approach for achieving a high-detectivity GeSn photodetector that may facilitate its potential applications.
physics, applied
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