Abstract:The conventional surface x-ray diffraction method [1] allows us to determine atomic arrangements of crystal surfaces and interfaces.While x-ray diffraction intensities distributed within a reciprocal lattice space are usually measured with a finetooth comb using the method, an overall image of the diffraction intensity profile is difficult to get until after such lengthy and time consuming measurement is completed.We proposed x-ray reciprocal-lattice space imaging method (X-ReSI) for straightforward understanding of 1D nanostructures such as NiO nanowires [2].The X-ReSI is a single-exposure diffraction technique which records the reciprocallattice pattern of a fixed crystalline nanostructure using a 2D detector.The fundamental idea behind the method is that the reciprocal lattice of 1D or 2D structures are an array of sheets or rods, respectively.Thus the reciprocal-lattice space can be recorded for a fixed sample with a 2D x-ray detector fixed.The typical exposure time is a few seconds to a few minutes using the 3rd generation x-ray source.We applied the method to structural evaluation of Bi nanolines being 1/8 monolayers in coverage on average.The results of the application reveal that Bi nanolines embeded in Si was found to have a 2 x n superstructure having Bi dimer bonds [3].On the other hand line structures in samples capped with an amorphous Si layer and having no cap layers still remained with a non-detectable amount of the 2 x n atomic structures.Other applications are structural determination of a Bi4Ti3O12 thinfilm and in-situ observation of a Au electrode in H2SO4.

Photoelectron holography of the si(001) surface

Study Of The Na-Si(111) 3x1 Interface Using Core-Level Photoemission Spectroscopy

Differential Photoelectron Holography: A New Approach for Three-Dimensional Atomic Imaging

Surface Vs. Bulk Electronic Structure of Silver Determined by Photoemission

STUDIES OF Na ADSORBED ORDERLY AND DISORDERLY ON Si(111) SURFACE USING PES

Reflection Surface X-Ray Diffraction Patterns: K-Space Images

Surface structure of the 3x3-Si phase on Al(111), studied by the multiple usages of positron diffraction and core-level photoemission spectroscopy

Self-energy Effects on the Surface-State Energies of H-Si(111)1 X 1.

Investigation of the atomic structure of surfaces by means of forward scattering of medium energy electrons

Studies of Beam Optics and Scattering in the Next Linear Collider Post-Linac Collimation System

Electronic-Structure And Its Dependence On Local Order For H/Si(111)-(1x1) Surfaces

Direct observation of the Si(110)-(16×2) surface reconstruction by atomic force microscopy

Photoinduced electron transfer at a Si(111) nanostructured surface: effect of varying light wavelength, temperature, and structural parameters

Atomic observation on diamond (001) surfaces with non-contact atomic force microscopy

Probing three-dimensional mesoscopic interfacial structures in a single view using multibeam X-ray coherent surface scattering and holography imaging

Studies of Fesi2/Si Quantum Dot Nano-Structures by X-Ray Bragg-Surface Diffractions (Bsd)

Photoelectron Holographic Study for Atomic Site Occupancy for Si Dopants in Si-Doped κ-Ga 2 O 3 (001)

The Atomic-Structure of Silicon and Metal-Surfaces

Optical Second-Harmonic Spectra of Si(001) with H and Ge Adatoms: First-principles Theory and Experiment

Ultrafast Electron Diffraction at Surfaces:From Nanoscale Heat Transport to Driven Phase Transitions

Recent advances in atomic resolution three-dimensional holography