Quantitative determination of atomic buckling of silicene by atomic force microscopy
Rémy Pawlak,Carl Drechsel,Philipp D’Astolfo,Marcin Kisiel,Ernst Meyer,Jorge Iribas Cerda
DOI: https://doi.org/10.1073/pnas.1913489117
IF: 11.1
2019-12-23
Proceedings of the National Academy of Sciences
Abstract:Significance Most 2D materials possess a prominent atomic buckling, in contrast to their flat graphene counterpart. Upon epitaxial growth, complex restructuring, defects, and grain boundaries coexist on the surface with variable corrugations complicating an accurate determination using conventional diffraction techniques. To address this, we use atomic force microscopy with CO-terminated tips and numerical calculations to unveil the structure, local symmetry, and defects of a prototypical buckled 2D system, e.g., silicene on Ag(111). Based on site-dependent force spectroscopy, we provide a quantitative determination of the buckling magnitude of these phases with subangstrom precision. This method offers opportunities to study the interplay between structural and electronic properties in other emerging buckled systems with unprecedented resolution.