Vertically grown ultrathin Bi 2 SiO 5 as high- κ single-crystalline gate dielectric

Jiabiao Chen,Zhaochao Liu,Xinyue Dong,Zhansheng Gao,Yuxuan Lin,Yuyu He,Yingnan Duan,Tonghuai Cheng,Zhengyang Zhou,Huixia Fu,Feng Luo,Jinxiong Wu
DOI: https://doi.org/10.1038/s41467-023-40123-1
IF: 16.6
2023-07-21
Nature Communications
Abstract:Single-crystalline high- κ dielectric materials are desired for the development of future two-dimensional (2D) electronic devices. However, curent 2D gate insulators still face challenges, such as insufficient dielectric constant and difficult to obtain free-standing and transferrable ultrathin films. Here, we demonstrate that ultrathin Bi 2 SiO 5 crystals grown by chemical vapor deposition (CVD) can serve as excellent gate dielectric layers for 2D semiconductors, showing a high dielectric constant (>30) and large band gap (~3.8 eV). Unlike other 2D insulators synthesized via in-plane CVD on substrates, vertically grown Bi 2 SiO 5 can be easily transferred onto other substrates by polymer-free mechanical pressing, which greatly facilitates its ideal van der Waals integration with few-layer MoS 2 as high- κ dielectrics and screening layers. The Bi 2 SiO 5 gated MoS 2 field-effect transistors exhibit an ignorable hysteresis (~3 mV) and low drain induced barrier lowering (~5 mV/V). Our work suggests vertically grown Bi 2 SiO 5 nanoflakes as promising candidates to improve the performance of 2D electronic devices.
multidisciplinary sciences
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