Investigation of carbon-related complexes in highly C-doped GaN grown by metalorganic vapor phase epitaxy

Anna Honda,Hirotaka Watanabe,Wakana Takeuchi,Yoshio HONDA,Hiroshi Amano,Takeshi Kato
DOI: https://doi.org/10.35848/1347-4065/ad3b54
IF: 1.5
2024-04-27
Japanese Journal of Applied Physics
Abstract:We investigated the C-related complexes in highly C-doped GaN by electron spin resonance (ESR) spectroscopy, Fourier transform IR spectroscopy (FTIR), and minority carrier transient spectroscopy (MCTS) measurements. In the ESR spectra, two resonances with g values of 2.02 and 2.04 were found to be assigned by (0/−) deep acceptor and (+/0) charge transition levels of carbon substituting for nitrogen site (CN). In the FTIR spectra, two local vibrational modes positioned at 1679 and 1718 cm−1 were confirmed to be associated with tri-carbon complexes of CN–CGa–CN (basal) and CN–CGa–CN (axial), respectively. In the MCTS spectra, we observed the hole trap level of Ev + 0.25 ± 0.1 eV associated with the tri-carbon complexes, which are the dominant C-related defects, suggesting that these complexes affect the electronic properties in the highly C-doped GaN.
physics, applied
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