Evaluation of the impact of solder die attach versus epoxy die attach in a state of the art power package

J. Czernohorsky,B. Maj,Matthias Viering,L. Wright,G. Balanon
DOI: https://doi.org/10.48550/arXiv.0801.1003
2008-01-07
General Physics
Abstract:Subject of this paper is the thermal investigation of epoxy (EDA) and solder (SDA) die attaches by a comparison of an ASIC with multiple heat sources in different package assemblies. Static and transient thermal measurements and simulations were performed to investigate the thermal behavior of two samples in a state of the art QFP power package differing only in the die attach material (EDA and SDA).
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