Interface Contact Thermal Resistance of Die Attach in High-Power Laser Diode Packages

Liting Deng,Te Li,Zhenfu Wang,Pu Zhang,Shunhua Wu,Jiachen Liu,Junyue Zhang,Lang Chen,Jiachen Zhang,Weizhou Huang,Rui Zhang
DOI: https://doi.org/10.3390/electronics13010203
IF: 2.9
2024-01-02
Electronics
Abstract:The reliability of packaged laser diodes is heavily dependent on the quality of the die attach. Even a small void or delamination may result in a sudden increase in junction temperature, eventually leading to failure of the operation. The contact thermal resistance at the interface between the die attach and the heat sink plays a critical role in thermal management of high-power laser diode packages. This paper focuses on the investigation of interface contact thermal resistance of the die attach using thermal transient analysis. The structure function of the heat flow path in the T3ster thermal resistance testing experiment is utilized. By analyzing the structure function of the transient thermal characteristics, it was determined that interface thermal resistance between the chip and solder was 0.38 K/W, while the resistance between solder and heat sink was 0.36 K/W. The simulation and measurement results showed excellent agreement, indicating that it is possible to accurately predict the interface contact area of the die attach in the F-mount packaged single emitter laser diode. Additionally, the proportion of interface contact thermal resistance in the total package thermal resistance can be used to evaluate the quality of the die attach.
engineering, electrical & electronic,computer science, information systems,physics, applied
What problem does this paper attempt to address?
This paper primarily explores the issue of interfacial contact thermal resistance in the packaging of high-power laser diodes, and conducts an in-depth study through theoretical simulation and experimental measurement. ### Research Background and Objectives - **Background**: With the widespread application of high-power laser diodes in solid-state laser pumping, as well as in industrial, scientific, and medical fields, higher demands are placed on the thermal management of devices. Since the failure rate of electronic devices due to overheating is as high as 55%, effective heat dissipation to maintain a safe operating junction temperature becomes crucial. - **Objectives**: The paper aims to study the interfacial contact thermal resistance of the die attach in high-power laser diode packaging and to explore its impact on the overall package thermal resistance. Specifically, by analyzing the interfacial contact thermal resistance between the chip and the solder, and between the solder and the heat sink, the quality of the die attach can be assessed, and the interfacial contact area and packaging quality of single-emitter laser diodes in actual working environments can be predicted. ### Research Methods 1. **Theoretical Simulation**: Using the Finite Element Method (FEM) for steady-state thermal characteristics simulation, a computational model under multi-point contact conditions is established to analyze the changes in interfacial contact thermal resistance with different contact interface areas (80%, 85%, 90%). 2. **Experimental Measurement**: Utilizing the T3ster thermal resistance tester for transient thermal characteristics testing, the relationship between cumulative thermal capacitance and thermal resistance in the heat flow path is analyzed through structural function theory to determine the specific values of interfacial thermal resistance. ### Main Findings - Through simulation and experimental measurement, the paper obtained results showing an interfacial thermal resistance of 0.38 K/W between the chip and the solder, and 0.36 K/W between the solder and the heat sink. These results indicate that the interfacial contact area of the die attach in single-emitter laser diode packaging can be accurately predicted. - Additionally, the proportion of interfacial contact thermal resistance in the total package thermal resistance can be used to evaluate the quality of the die attach, which is of great significance for improving the reliability and performance stability of high-power laser diodes.