Si-doped (AlGa)2O3 growth on a-, m- and r-plane α-Al2O3 substrates by molecular beam epitaxy

Hironori Okumura,Andréa Fassion,Cédric Mannequin
DOI: https://doi.org/10.35848/1347-4065/ad3e57
IF: 1.5
2024-05-04
Japanese Journal of Applied Physics
Abstract:We reported the growth of (AlGa)2O3 layers on (11 0), (10 0), and (10 2) α-Al2O3 substrates using MBE, and the electrical characterization of Si-doped (AlGa)2O3 layers. The Ga2O3 layers grown on (10 0) and (10 2) α-Al2O3 were α-phase single crystals, while the Ga2O3 layer grown on (11 0) α-Al2O3 consisted of (11 0) α-Ga2O3 and ( 01) β-Ga2O3. The Al composition of the (11 0) and (10 0) (AlGa)2O3 layers was controlled by varying the Al flux. The Si-doped (10 0) α-(AlxGa1-x)2O3 layers with x = 0–0.41 were electrically conducting.
physics, applied
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