Effects of deep-level defects on the current distortion of CZT γ-ray detector under temporal response

Xiang Chen,Wang-yong Chen,Yi Lu,Jun-hong Liu,Kan Zhang,Qi-hang Hu
DOI: https://doi.org/10.1109/tns.2024.3382169
IF: 1.703
2024-01-01
IEEE Transactions on Nuclear Science
Abstract:Under high flux rate γ-ray, the relationships between the current distortion and the specific defect levels in CZT detector are analyzed. Sentaurus TCAD software, Pockels effect test system, and γ-ray radiation instrument are operated in this study. The theoretical and experimental results show that the sharp peak and the flat current nonlinearity of the temporal response for CZT detector under γ-ray radiation are mainly contributed by the trapping, de-trapping effects of deep-level defect on γ-ray-generated carriers. The electric field intensity distribution in CZT crystal follows linearity with the distance from the cathode with and without the γ-ray flux rate of 1.33×108 MeV·cm-2·Es-1. The improvement effect of IR illumination on the current distortion is the increase of the effective ionized density for deep-level defect and the trapping probability for electrons, leading to the suppression of the sharp peak phenomenon. These results can help us better understand the current distortion of CZT detector under high flux rate radiation, which can provide significant theoretical supports for further research on distortion suppression and performance optimization.
engineering, electrical & electronic,nuclear science & technology
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