Abstract:X-ray photoelectron spectroscopy (XPS) measurements and ab-initio calculations of the XPS chemical shift were performed to identify chemical species on plasma-treated polytetrafluoroethylene (PTFE) surfaces. The obtained C1s-XPS and O1s-XPS spectra confirmed the generation of oxygen-containing functional groups on plasma-treated PTFE surfaces. We investigated the effect of the substitution of F atoms in a CF 2 – chain by H atoms on the C1s core level binding energy in PTFE; our calculations showed that the C1s core level binding energy is linearly dependent on the number of substituted F atoms. This finding enables us to infer the number of substituted F atoms from the experimentally observed C1s-XPS spectra. We deconvoluted the experimentally observed C1s-XPS spectra of the plasma-treated PTFE surfaces using the calculated binding energies of various functional groups. It is impossible to reproduce the C1s-XPS spectra using the C1s core level binding energies of functional groups in the CF 2 – chain. However, they can be well reproduced by adding the calculated binding energies of the functional groups in the CH 2 – chain, indicating the substitution of the F atoms by the H atoms by plasma treatment. Furthermore, the time-of-flight secondary ion mass spectrometry confirmed the existence of H atoms on the plasma-treated PTFE surfaces.

Extremely low sputtering degradation of polytetrafluoroethylene by C60 ion beam applied in XPS analysis

Thermal and thermo-oxidative degradation of high density polyethylene/fullerene composites

Studies of C-60 Films Deposited Using Ionized Cluster Beam Deposition Technique

Destruction of C-60 Films by Boron Ion-Bombardment

Deposition of C60 Films by Partially Ionized Fullerene Beams

Electron-stimulated Reaction of C60 with a Model Etching Gas, SF6

Structural and Electronic Studies of C60 Films Deposited Using a New Technique of Neutral Cluster Beam Deposition

Kinetics of Electron-Beam Dispersion of Fullerite C60

Deposition of PTFE thin films by ion beam sputtering and a study of the ion bombardment effect

Fragmentation of C60 Molecules in Partially Ionized Fullerene Beam Deposition

Systematic Studies of Fullerene Derivative Electron Beam Resists

Advanced Carbon-Based Material C[sub 60] Modification Using Partially Ionized Cluster and Energetic Beams

A Fullerene Derivative As an Electron Beam Resist for Nanolithography

A low power 50 Hz argon plasma for surface modification of polytetrafluoroethylene

Electron-Beam-Induced Radiation Effects on Siloxane Foam

Tuning of C-60 Energy Levels Using Orientation-Controlled Phthalocyanine Films

Exposure mechanism of fullerene derivative electron beam resists

Electron-beam Damage of C60 Films on Hydrogen-Passivated Si(100)

Low-Temperature Synthesis of C-60 Thin Films by Ionized Cluster Beam Deposition Technique

Identification of chemical species on plasma-treated polytetrafluoroethylene surface by ab-initio calculations of core-energy-level shift in X-ray photoelectron spectra

Electron-Beam-Induced Fragmentation In Ultrathin C-60 Films On Si(100)-2x1-H: Mechanisms Of Cage Destruction