High resolution strain measurements in highly disordered materials

Mark Sutton,Julien R. M. Lhermitte,Françoise Ehrburger-Dolle,Frédéric Livet
DOI: https://doi.org/10.1103/PhysRevResearch.3.013119
2021-02-09
Physical Review Research
Abstract:The ability to measure small deformations or strains is useful for understanding many aspects of materials. Here, an alternate analysis of speckle x-ray diffraction peaks is presented in which the systematic shifts of the speckles are analyzed allowing for strain (or flow) patterns to be inferred. This speckle tracking technique measures strain patterns with an accuracy similar to x-ray single crystal measurements but in amorphous or highly disordered materials. https://doi.org/10.1103/PhysRevResearch.3.013119 Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI. Published by the American Physical Society
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