Intermitted 3D diffraction tomography combined with in situ Laue diffraction to characterize dislocation structures and stress fields in micro bending cantilevers
J.-B. Molin,L. Renversade,J.-S. Micha,O. Ulrich,O. Robach,P.A. Gruber,C. Kirchlechner
DOI: https://doi.org/10.1002/adem.202400357
IF: 3.6
2024-06-16
Advanced Engineering Materials
Abstract:The mechanisms of plastic deformation are investigated using different characterization tools as SEM, TEM or synchrotron‐based X‐ray technique like Laue microdiffraction (μLaue). However, structural information can be limited to the specimen surface (SEM), to extremely thin samples (TEM) or due to depth averaging (μLaue). Until today, a non‐destructive in situ investigation of a dislocation population, and de facto, the determination of the local stress tensor in bulk samples remains challenging. To decompose the depth integrated Laue microdiffraction signals, we used the so‐called "Differential Aperture X‐Ray Microscopy" (DAXM),,allowing the 3D determination of the local structural crystal properties. Using this approach, the local crystallographic phase, orientation, and the elastic strain tensor are obtained with 1μm3 voxel size. In order to accomplish the experiment, a protocol and a new combined in situ mechanical testing rig with a DAXM microscope was created. The experiment was conducted on a severely bent focused ion beam copper single crystal microcantilever (10x10x25μm3). The local deviatoric strain tensor and the local lattice curvature in the deformed sample were analysed in 3D. The advantages and resolution limits of the technique will be discussed in detail. This article is protected by copyright. All rights reserved.
materials science, multidisciplinary