Far‐Field Parallel Direct Writing of Sub‐Diffraction‐Limit Metallic Nanowires by Spatially Modulated Femtosecond Vector Beam

Liang Zhao,Lingyu Huang,Jiaxu Huang,Kang Xu,Min Wang,Shaolin Xu,Xinwei Wang
DOI: https://doi.org/10.1002/admt.202200125
IF: 6.8
2022-04-10
Advanced Materials Technologies
Abstract:This work reports a far‐field femtosecond laser direct writing technology with a low‐numerical aperture objective lens for metallic nanowire array fabrication, bringing in ingenious tunability to break the diffraction limit by employing a spatially modulated dual‐peak vector beam. This method provides an alternative way for the fabrication of sub‐diffraction‐limit metallic nanowires in the field of flexible electric devices.Metallic nanowires have exhibited paramount importance in achieving functional electrical, electrochemical, and optical performances due to their unique physicochemical properties. Efficient fabrication of the nanowires with controllable geometry and line width is highly required in related applications. Here a new far‐field laser parallel direct writing approach for fabricating nanowire array far beyond the diffraction limit by a modulated vector beam with dual‐peak intensity distribution is reported. Such a modulated beam can perform selective laser ablation to fabricate nanowires, whose line width can be largely reduced by tuning the dual‐peak orientation relative to the laser scanning direction. As a demonstration, a 157 nm‐wide (less than λ/3) gold nanowire, reaching ≈1/20 of the diffraction limit, has been fabricated in far field by using a low numerical aperture microscope objective (NA = 0.1). The nanowire fabrication efficiency is also largely improved by applying multifocal modulated vector beams for parallel processing.
materials science, multidisciplinary
What problem does this paper attempt to address?