Multimodule microwave assembly for fast readout and charge-noise characterization of silicon quantum dots

Felix-Ekkehard von Horstig,David J. Ibberson,Giovanni A. Oakes,Laurence Cochrane,David F. Wise,Nadia Stelmashenko,Sylvain Barraud,Jason A.W. Robinson,Frederico Martins,M. Fernando Gonzalez-Zalba
DOI: https://doi.org/10.1103/physrevapplied.21.044016
IF: 4.6
2024-04-09
Physical Review Applied
Abstract:Fast measurements of quantum devices is useful in areas such as quantum sensing, quantum computing, and nanodevice quality analysis. Here, we develop a superconductor-semiconductor multimodule microwave assembly to demonstrate charge-state readout at the state of the art. The assembly consist of a superconducting readout resonator interfaced to a silicon-on-insulator (SOI) chiplet containing quantum dots (QDs) in a high- κ nanowire transistor. The superconducting chiplet contains resonant and coupling elements as well as LC filters that, when interfaced with the silicon chip, result in a resonant frequency f=2.12 GHz, a loaded quality factor Q=850 , and a resonator impedance Z=470Ω . Combined with the large gate lever arms of SOI technology, we achieve a minimum integration time for single and double QD transitions of 2.77 and 13.5 ns, respectively. We utilize the assembly to measure charge noise over 9 decades of frequency up to 500 kHz and find a 1/f dependence across the whole frequency spectrum as well as a charge-noise level of 4μeV/Hz at 1 Hz. The modular microwave circuitry presented here can be directly utilized in conjunction with other quantum devices to improve the readout performance as well as enable large bandwidth noise spectroscopy, all without the complexity of superconductor-semiconductor monolithic fabrication. https://doi.org/10.1103/PhysRevApplied.21.044016 Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI. Published by the American Physical Society
physics, applied
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