Development and testing of a dual‐frequency real‐time hardware feedback system for the hard X‐ray nanoprobe beamline of the SSRF

Zhisen Jiang,Hui Jiang,Yinghua He,Yan He,Dongxu Liang,Huaina Yu,Aiguo Li,Riccardo Signorato
DOI: https://doi.org/10.1107/s1600577524010208
IF: 2.557
2024-12-08
Journal of Synchrotron Radiation
Abstract:We introduce a novel approach for a real‐time dual‐frequency feedback system which has been firstly used at the hard X‐ray nanoprobe beamline of Shanghai Synchrotron Radiation Facility. It can efficiently stabilize the X‐ray beam position and stability in parallel, making use of different optical systems in the beamline.A novel dual‐frequency real‐time feedback system has been developed to simultaneously optimize and stabilize beam position and energy at the hard X‐ray nanoprobe beamline of the Shanghai Synchrotron Radiation Facility. A user‐selected cut‐off frequency is used to separate the beam position signal obtained from an X‐ray beam position monitor into two parts, i.e. high‐frequency and low‐frequency components. They can be real‐time corrected and optimized by two different optical components, one chromatic and the other achromatic, of very different inertial mass, such as Bragg monochromator dispersive elements and a pre‐focusing total external reflection mirror. The experimental results shown in this article demonstrate a significant improvement in position and energy stabilities. The long‐term beam angular stability clearly improved from 2.21 to 0.92 μrad RMS in the horizontal direction and from 0.72 to 0.10 μrad RMS in the vertical direction.
optics,physics, applied,instruments & instrumentation
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