Time resolution of a SiGe BiCMOS monolithic silicon pixel detector without internal gain layer with a femtosecond laser

M. Milanesio,L. Paolozzi,T. Moretti,A. Latshaw,L. Bonacina,R. Cardella,T. Kugathasan,A. Picardi,M. Elviretti,H. Rücker,R. Cardarelli,L. Cecconi,C.A. Fenoglio,D. Ferrere,S. Gonzalez-Sevilla,L. Iodice,R. Kotitsa,C. Magliocca,M. Nessi,A. Pizarro-Medina,J. Sabater Iglesias,I. Semendyaev,J. Saidi,M. Vicente Barreto Pinto,S. Zambito,G. Iacobucci
DOI: https://doi.org/10.1088/1748-0221/19/04/p04029
2024-04-26
Journal of Instrumentation
Abstract:The time resolution of the second monolithic silicon pixel prototype produced for the MONOLITH H2020 ERC Advanced project was studied using a femtosecond laser. The ASIC contains a matrix of hexagonal pixels with 100 μm pitch, readout by low-noise and very fast SiGe HBT frontend electronics. Silicon wafers with 50 μm thick epilayer with a resistivity of 350 Ωcm were used to produce a fully depleted sensor. At the highest frontend power density tested of 2.7 W/cm 2 , the time resolution with the femtosecond laser pulses was found to be 45 ps for signals generated by 1200 electrons, and 3 ps in the case of 11k electrons, which corresponds approximately to 0.4 and 3.5 times the most probable value of the charge generated by a minimum-ionizing particle. The results were compared with testbeam data taken with the same prototype to evaluate the time jitter produced by the fluctuations of the charge collection.
instruments & instrumentation
What problem does this paper attempt to address?