Abstract:Standard cells are essential components of modern digital circuit designs. With process technologies advancing toward 2nm, more routability issues have arisen due to the decreasing number of routing tracks, increasing number and complexity of design rules, and strict patterning rules. The state-of-the-art standard cell design automation framework is able to automatically design standard cell layouts in advanced nodes, but it is still struggling to generate highly competitive Performance-Power-Area (PPA) and routable cell layouts for complex sequential cell designs. Consequently, a novel and efficient methodology incorporating the expertise of experienced human designers to incrementally optimize the PPA of cell layouts is highly necessary and essential. High-quality device clustering, with consideration of netlist topology, diffusion sharing/break and routability in the layouts, can reduce complexity and assist in finding highly competitive PPA, and routable layouts faster. In this paper, we leverage the natural language and reasoning ability of Large Language Model (LLM) to generate high-quality cluster constraints incrementally to optimize the cell layout PPA and debug the routability with ReAct prompting. On a benchmark of sequential standard cells in 2nm, we demonstrate that the proposed method not only achieves up to 19.4% smaller cell area, but also generates 23.5% more LVS/DRC clean cell layouts than previous work. In summary, the proposed method not only successfully reduces cell area by 4.65% on average, but also is able to fix routability in the cell layout designs.

Standard Cell Library Evaluation with Multiple lithography-compliant verification and Improved Synopsys Pin Access Checking Utility

Constraining the Synopsys Pin Access Checker Utility for Improved Standard Cells Library Verification Flow

Multiple-Lithography-Compliant Verification for Standard Cell Library Development Flow

A Fast OPC Algorithm for IC Layout Based on 1-D Cells after Optimization of Gap Distribution

A novel layout automation flow to facilitate test chip design for standard cell characterization

An Automated System for Checking Lithography Friendliness of Standard Cells

The Ispd-2012 Discrete Cell Sizing Contest And Benchmark Suite

An improved benchmark suite for the ISPD-2013 discrete cell sizing contest.

Standard Cell Library Design and Optimization Methodology for ASAP7 PDK

Development and Verification of A Small Cmos Digital Standard Cell Library Based on Smic 130nm Process

Large Language Model (LLM) for Standard Cell Layout Design Optimization

Impact Study of Layout-Dependent Effects Toward FinFET Combinational Standard Cell Optimization

An improved method for test chip design

Migrating Standard Cells for Multiple Drive Strengths by Routing Imitation

Standard cell library establishment and simulation for scan D flip-flops based on 0.5 micron CMOS mixed-signal process

Efficient Aging-Aware Standard Cell Library Characterization Based on Sensitivity Analysis

A Fully Automated Large-Scale Addressable Test Chip Design with High Reliability

Design for Manufacturability of Deep Sub-Micron Standard Cell Library

Validation of Standard Cell Library

Self-Aligned Double Patterning Friendly Configuration for Standard Cell Library Considering Placement

Methodology for standard cell compliance and detailed placement for triple patterning lithography