Interlayer Coupling Limit in Artificially Stacked MoS2 Homojunctions

Juan C. Arias‐Muñoz,Henri Kaaripuro,Yi Zhang,Susobhan Das,Henry A. Fernandez,Zhipei Sun
DOI: https://doi.org/10.1002/adfm.202310365
IF: 19
2023-12-08
Advanced Functional Materials
Abstract:The paper examines the constraints of interlayer coupling in synthetically stacked MoS2 flakes, assessing the impact of stacking variables on the vertical architectures of two‐dimensional (2D) structures with varying thicknesses. A clear difference between 2D stacked metamaterials and interface‐driven stackings is established as a new design criterion for 2D material‐based devices for optoelectronics. Interlayer interactions are one of the crucial parameters of two‐dimensional (2D) layered materials‐based junctions. Understanding the limits of interlayer coupling and defining the "maximum building block thickness" in artificially stacked 2D layered materials are key tasks that hold significant importance, not only in fundamental physics, but also in practical applications such as electronics, photonics, and optoelectronics. Here, the interlayer coupling limits are optically investigated of a model 2D layered semiconductor, MoS2, revealing the evolution of distinct interaction mechanisms between layers via artificial stacking. As the total thickness increases, a reduction in the stacking angle influence on the properties of the homojunctions is reflected in the photoluminescence and second harmonic generation responses. The results show that the effective coupling limit for vertically stacked 2D metamaterials resides in three‐layer flakes. The findings pave the way to advanced and complex devices of 2D superlattices for photonics and optoelectronics.
materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,nanoscience & nanotechnology
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