Observation of Strong Interlayer Coupling in MoS2/WS2 Heterostructures

Jing Zhang,Jinhuan Wang,Peng Chen,Yue Sun,Shuang Wu,Zhiyan Jia,Xiaobo Lu,Hua Yu,Wei Chen,Jianqi Zhu,Guibai Xie,Rong Yang,Dongxia Shi,Xiulai Xu,Jianyong Xiang,Kaihui Liu,Guangyu Zhang
DOI: https://doi.org/10.1002/adma.201504631
IF: 29.4
2015-01-01
Advanced Materials
Abstract:Epitaxial growth of A-A and A-B stacking MoS2 on WS2 via a two-step chemical vapor deposition method is reported. These epitaxial heterostructures show an atomic clean interface and a strong interlayer coupling, as evidenced by systematic characterization. Low-frequency Raman breathing and shear modes are observed in commensurate stacking bilayers for the first time; these can serve as persuasive fingerprints for interfacial quality and stacking configurations.
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