Abstract:During circuit conduction immunity simulation assessments, the existing black-box modeling methods for chips generally involve the use of time-domain-based modeling methods or ICIM-CI binary decision models, which can provide approximate immunity assessments but require a high number of tests to be performed when carrying out broadband immunity assessments, as well as having a long modeling time and demonstrating poor reproducibility and insufficient accuracy in capturing the complex electromagnetic response in the frequency domain. To address these issues, in this paper, we propose a novel frequency-domain broadband model (Sensi-Freq-Model) of IC conduction susceptibility that accurately quantifies the conduction immunity of components in the frequency domain and builds a model of the IC based on the quantized data. The method provides high fitting accuracy in the frequency domain, which significantly improves the accuracy of circuit broadband design. The generated model retains as much information within the frequency-domain broadband as possible and reduces the need to rebuild the model under changing electromagnetic environments, thereby enhancing the portability and repeatability of the model. The ability to reduce the modeling time of the chip greatly improves modeling efficiency and circuit design. The results of this study show that the "Sensi-Freq-Model" reduces the broadband modeling time by about 90% compared to the traditional ICIM-CI method and improves the normalized mean square error (NMSE) by 18.5 dB.

What problem does this paper attempt to address?

The problems that this paper attempts to solve are several key issues in the black - box modeling methods in the existing integrated circuit (IC) conductive immunity simulation evaluation. Specifically: 1. **High test requirements**: The existing time - domain - based modeling methods or ICIM - CI binary decision models need to perform a large number of tests when conducting broadband immunity evaluation. 2. **Long - time modeling**: The modeling time of these methods is relatively long. 3. **Poor repeatability and accuracy**: These methods perform poorly in capturing complex electromagnetic responses in the frequency domain, resulting in insufficient repeatability and accuracy. 4. **Poor adaptability and portability**: When the electromagnetic environment changes, it is necessary to frequently rebuild the model, which increases the workload and time consumption. 5. **Limited ability to handle nonlinear characteristics**: The existing ICIM - CI model has limitations in handling the nonlinear characteristics of the chip when it is interfered with. Usually, a linear assumption needs to be made, which leads to differences between the model and the actual measurement results. 6. **Unable to perform parametric simulation**: Due to the pass / fail (go - no - go) decision criteria, these models cannot support parametric simulation, which limits their ability to accurately predict and conduct detailed analysis of the performance on integrated circuits in complex electromagnetic environments, and also hinders circuit designers from integrating the chip into the cascaded simulation of the entire circuit board. In order to solve these problems, the paper proposes a new frequency - domain broadband model (Sensi - Freq - Model) based on X - parameter theory, aiming to improve the adaptability, portability and modeling efficiency of the model, while providing higher fitting accuracy and wider applicability. This model can accurately quantify the conductive immunity of components in the frequency domain and construct an IC model based on the quantified data, thereby significantly improving the accuracy of circuit broadband design.

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