A Systematic Coupled Approach For Electromagnetic Susceptibility Analysis Of A Shielded Device With Multilayer Circuitry

W. Yuan,E.-P. Li
DOI: https://doi.org/10.1109/TEMC.2005.859062
IF: 2.036
2005-01-01
IEEE Transactions on Electromagnetic Compatibility
Abstract:This paper presents a systematic coupled approach for electromagnetic susceptibility (EMS) analysis of a shielded electronic device in the presence of an ambient electromagnetic interference (EMI). A full-wave electromagnetic modeling technique coupled with a circuit-based method is developed for the overall EMS performance analysis. The mixed-potential electric field integral equation (MPIE) is formulated via the method of moments to model the electromagnetic properties of an arbitrary structure consisting of wires and surfaces with any applied excitation. With numerical analysis, the effect of an ambient electromagnetic noise is characterized, and an equivalent circuit model is extracted for further analysis of EMI to internal high-speed sensitive circuits. Numerous examinations exhibit that this systematic coupled approach is a computationally efficient method to address the EMS problems at system level, in which the external EMI effects are fully considered and the circuit-based simulator is also exploited.
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