Enhanced Performance of Self‐Powered Ge Schottky Photodetectors Enabled by 2D hBN Monolayer Passivation

HyunJung Park,Munho Kim
DOI: https://doi.org/10.1002/admt.202400594
IF: 6.8
2024-07-20
Advanced Materials Technologies
Abstract:The novel concept of self‐powered photodiodes is introduced based on the hBN/Ge Schottky junction with a comparison of the conventional Al2O3 passivation layer. This approach utilizes surface passivation by hBN on Ge, resulting in enhanced photodiode performance. The integration of hBN monolayer onto Ge presents a promising pathway for developing high‐performance self‐powered optical sensors with low power consumption. Ensuring high‐quality surface passivation is the key to realizing high‐performance self‐powered optoelectronic devices, as it significantly impacts carrier transport. 2D hexagonal boron nitride (hBN) exhibits exceptional material characteristics, including a wide bandgap, high dielectric constant, minimized dangling bonds, and high chemical stability, making it one of the most promising candidates for high‐quality passivation. Nevertheless, the passivation characteristics of hBN on Ge and their influence on self‐powered photodetection remain unexplored, as well as their effects on carrier recombination lifetime, interface defect density, and Schottky barrier height. In this study, the first demonstration of enhanced Schottky junction photodiode characteristics and the impact of the surface passivation on carrier lifetime and defect density using an hBN monolayer on Ge are presented. The characteristics of hBN/Ge with Al2O3/Ge are compared to demonstrate the superior passivation quality of hBN over conventional materials. These results highlight the significant potential of hBN as an effective passivation for optoelectronic device applications.
materials science, multidisciplinary
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