Abstract:Microscopic imaging of local magnetic fields provides a window into the organizing principles of complex and technologically relevant condensed matter materials. However, a wide variety of intriguing strongly correlated and topologically nontrivial materials exhibit poorly understood phenomena outside the detection capability of state-of-the-art high-sensitivity, high-resolution scanning probe magnetometers. We introduce a quantum-noise-limited scanning probe magnetometer that can operate from room to cryogenic temperatures with unprecedented DC-field sensitivity and micron-scale resolution. The Scanning Quantum Cryogenic Atom Microscope (SQCRAMscope) employs a magnetically levitated atomic Bose-Einstein condensate (BEC), thereby providing immunity to conductive and blackbody radiative heating. It has a field sensitivity of 1.4 nT per resolution-limited point ($\sim$2 $\mu$m), or 6 nT/$\sqrt{\text{Hz}}$ per point at its duty cycle. Compared to point-by-point sensors, the long length of the BEC provides a naturally parallel measurement, allowing one to measure nearly one-hundred points with an effective field sensitivity of 600 pT$/\sqrt{\text{Hz}}$ for each point during the same time as a point-by-point scanner would measure these points sequentially. Moreover, it has a noise floor of 300 pT and provides nearly two orders of magnitude improvement in magnetic flux sensitivity (down to $10^{-6}$ $\Phi_0/\sqrt{\text{Hz}}$) over previous atomic probe magnetometers capable of scanning near samples. These capabilities are, for the first time, carefully benchmarked by imaging magnetic fields arising from microfabricated wire patterns, in a system where samples may be scanned, cryogenically cooled, and easily exchanged. The SQCRAMscope will provide charge transport images at temperatures from room to 4 K in unconventional superconductors and topologically nontrivial materials.

Frequency Following Imaging of Electric Fields from Resonant Superconducting Devices using a Scanning Near-Field Microwave Microscope

Superconducting Material Diagnostics using a Scanning Near-Field Microwave Microscope

Spatially Resolved Characterization of the Microwave Properties of Superconducting Thin Films by Low Temperature Microwave Scanning Near-Field Microscopy

Nondestructive Imaging of the Microwave Properties of Superconducting Thin Film Devices with a Scanning Microwave Near-Field Microscope

Probing the Local Microwave Properties of Superconducting Thin Films by a Scanning Microwave Near-Field Microscope

Microscope for Electromagnetic Field Distribution Imaging with Intrinsic Josephson Junctions

Broadband dielectric microwave microscopy on $μ$m length scales

Temperature-dependent local electromagnetic characterization of electronic materials by scanning microwave near-field technique

A near-field scanning SQUID microwave microscope

Atomic-force-microscope-compatible Near-Field Scanning Microwave Microscope with Separated Excitation and Sensing Probes

Microwave Atomic Force Microscopy Imaging for Nanometer-Scale Electrical Property Characterization.

Nanoscale imaging of super-high-frequency microelectromechanical resonators with femtometer sensitivity

Nondestructive Evaluation of the Dielectric Properties of the Substrate Materials for High-T-C Superconducting Microwave Devices

Scanning Quantum Cryogenic Atom Microscope

Nonlinear Near-Field Microwave Microscope For RF Defect Localization in Superconductors

Quantitative imaging of dielectric permittivity and tunability with a near-field scanning microwave microscope

Quantitative topographic imaging using a near-field scanning microwave microscope

Phase-resolved visualization of radio-frequency standing waves in superconducting spiral resonator for metamaterial applications

Apparatus for high resolution microwave spectroscopy in strong magnetic fields

Local microwave characterization of metal films using a scanning microwave near-field microscope

In-situ electro-optic sampling of microwave signals under cryogenic conditions and for superconducting applications