Abstract:With the development of nanotechnology in recent years, many researchers have focused on the development of nanomaterials and nanostructures such as nanowires. To apply these nanomaterials and nanostructures into nanodevices, there are great needs of the quantitative measurement of electrical properties of materials in an infinitesimal area. Recently, it has been reported that the microwave gives an effect to an interatomic force in local area among materials. Therefore, it is thought that an identification of materials and an evaluation of electrical characteristics become possible by clarifying the relation between microwave and interatomic force. Therefore, we investigated interatomic force under the tip of probe by focusing on the force-distance curve measurement using microwave atomic force microscopy (M-AFM) as the first step. This paper describes the method and the results of the force-distance curve measurement on the sample of Au, Si, and glass. Results of this experiment indicate actually that the effect of microwave is large in material which has high electric conductivity.

Local microwave characterization of metal films using a scanning microwave near-field microscope

Probing the Local Microwave Properties of Superconducting Thin Films by a Scanning Microwave Near-Field Microscope

Spatially Resolved Characterization of the Microwave Properties of Superconducting Thin Films by Low Temperature Microwave Scanning Near-Field Microscopy

Nondestructive Imaging of the Microwave Properties of Superconducting Thin Film Devices with a Scanning Microwave Near-Field Microscope

High Frequency Dielectric Properties Distribution of Bifeo3 Thin Film Using Near-Field Microwave Microscopy

Structure Modification of M-AFM Probe for the Measurement of Local Conductivity

Temperature-dependent local electromagnetic characterization of electronic materials by scanning microwave near-field technique

Local Permittivity Measurement of Dielectric Materials Based on the Non-Contact Force Curve of Microwave Atomic Force Microscopy

Quantitative Evaluation of Local Permittivity of Semiconductor Nanomaterials Using Microwave Atomic Force Microscopy

Microwave Atomic Force Microscopy Imaging for Nanometer-Scale Electrical Property Characterization.

Non-contact Local Conductivity Measurement of Metallic Nanowires Based on Semi-Near-field Reflection of Microwave Atomic Force Microscopy

J0610104 Evaluation of Interatomic Force on the Tip of Probe by Using Microwave Atomic Force Microscope

Microwave Atomic Force Microscopy: Quantitative Measurement and Characterization of Electrical Properties on the Nanometer Scale

Atomic-force-microscope-compatible Near-Field Scanning Microwave Microscope with Separated Excitation and Sensing Probes

Influence of Material Surface on the Measurement of Local Electrical Conductivity Using Microwave Atomic Force Microscopy

Measurement of High Frequency Conductivity of Oxide-Doped Anti-Ferromagnetic Thin Film with a Near-Field Scanning Microwave Microscope

Fabrication of oscillating metal probe for dynamic scanning microwave microscopy

Measurement of electrical properties of materials under the oxide layer by microwave-AFM probe

T0401-2-1 Development of a Microwave AFM Probe for the Evaluation of Electrical Properties

Investigation of Microwave Electromagnetic Characteristics for the Nanomagnetic Films

Superconducting Material Diagnostics using a Scanning Near-Field Microwave Microscope