Abstract:We have developed a low temperature, high-resolution microwave surface impedance probe that is able to operate in high static magnetic fields. Surface impedance is measured by cavity perturbation of dielectric resonators, with sufficient sensitivity to resolve the microwave absorption of sub-mm-sized superconducting samples. The resonators are constructed from high permittivity single-crystal rutile (TiO2) and have quality factors in excess of 10^6. Resonators with such high performance have traditionally required the use of superconducting materials, making them incompatible with large magnetic fields and subject to problems associated with aging and power-dependent response. Rutile resonators avoid these problems while retaining comparable sensitivity to surface impedance. Our cylindrical rutile resonators have a hollow bore and are excited in TE_01(n-d) modes, providing homogeneous microwave fields at the center of the resonator where the sample is positioned. Using a sapphire hot-finger technique, measurements can be made at sample temperatures in the range 1.1 K to 200 K, while the probe itself remains immersed in a liquid helium bath at 4.2 K. The novel apparatus described in this article is an extremely robust and versatile system for microwave spectroscopy, integrating several important features into a single system. These include: operation at high magnetic fields; multiple measurement frequencies between 2.64 GHz and 14.0 GHz in a single resonator; excellent frequency stability, with typical drifts < 1 Hz per hour; the ability to withdraw the sample from the resonator for background calibration; and a small pot of liquid helium separate from the external bath that provides a sample base temperature of 1.1 K.

Broadband dielectric microwave microscopy on $μ$m length scales

Quantitative imaging of dielectric permittivity and tunability with a near-field scanning microwave microscope

Microwave Atomic Force Microscopy Imaging for Nanometer-Scale Electrical Property Characterization.

Frequency Following Imaging of Electric Fields from Resonant Superconducting Devices using a Scanning Near-Field Microwave Microscope

Atomic-force-microscope-compatible Near-Field Scanning Microwave Microscope with Separated Excitation and Sensing Probes

Dielectric microscopy with submillimeter resolution

Broadband All‐Dielectric Magnifying Lens for Far‐Field High‐Resolution Imaging

Experimental Demonstration of an Ultra-Broadband Subwavelength Resolution Probe from Microwave to Terahertz Regime

Tapping mode microwave impedance microscopy.

Local microwave characterization of metal films using a scanning microwave near-field microscope

Apparatus for high resolution microwave spectroscopy in strong magnetic fields

Microwave Microscopy and Its Applications

Penetrative Imaging Of Sub-Surface Microstructures With A Near-Field Microwave Microscope

Ultra-broadband near-field Josephson microwave microscopy

Full-wave Modeling of Broadband Near Field Scanning Microwave Microscopy.

High Spatial Resolution Quantitative Microwave Impedance Microscopy by a Scanning Tip Microwave Near-Field Microscope

Quantitative Microwave Near-Field Microscopy of Dielectric Properties

Superconducting Material Diagnostics using a Scanning Near-Field Microwave Microscope

A near-field scanning SQUID microwave microscope

Construction of a Gigahertz-Bandwidth Radio-Frequency Scanning Tunneling Microscope Based on a Commercial Low-Temperature System

The EDMR Microscope - Combining Conductive Atomic Force Microscopy with Electrically Detected Magnetic Resonance